Fault Tolerance for Alu - Evaluated Module Redundancy Technique

Subharani, S.; Palaniappan, Ramanathan

doi:10.1109/sicici.1992.641653

Cited by 1 publication

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“…High reliability and uninterrupted operations in computing systems are much more vital in certain applications such as spacecraft navigation, aircraft flight control and landing systems, nuclear power plants, and chemical industries. Failures or malfunctioning of any equipment or its components in any such application leads to disastrous effects [5]. So our main concern is to have high reliable system in critical applications.…”

Section: Introductionmentioning

confidence: 99%

Redundancy Based Design and Analysis of ALU Circuit Using CMOS 180nm Process Technology for Fault Tolerant Computing Architectures

Singh¹,

Pashaie²,

Kumar³

2015

IJCDS

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As the technology entering into Nano dimensions, the manufacturing processes are becoming less reliable, that is drastically impacting the yield. Therefore, fault tolerant systems are becoming more important, particularly in safety-critical applications. In this paper, we present the design and analysis of 4-bit Arithmetic and Logical Unit (ALU) circuit designed using CMOS 180 nm process technology for fault tolerant computing architectures. As, ALU is a functional block of the Central Processing Unit (CPU) of a computer system. It is highly recommended that the ALU block must be fault free or fault tolerant one. In order to have high reliability and high up time of the system, we have used the classical Triple Modular Redundancy (TMR) technique in which three redundant subsystems are used in order to attain high reliability. We have achieved lower power dissipation with higher reliability of ALU circuit. The Voter Logic and Fault detection circuits are also designed and reported in this paper.

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Section: Introductionmentioning

confidence: 99%