2018
DOI: 10.1007/s10854-018-8534-1
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Facile, one step synthesis of non-toxic kesterite Cu2ZnSnS4 nanoflakes thin film by chemical bath deposition for solar cell application

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Cited by 9 publications
(4 citation statements)
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“…Furthermore, BaS and Cu 2 SnS 3 secondary phases could also be resolved by Raman spectroscopy. 33,34 Fig. 2 shows the Raman spectra of Cu 2 Ba x SnS 4 ( x = 0.2, 0.4, 0.6, 0.8, and 1 M) and Fe-doped Cu 2 Ba 0.9 Fe 0.1 SnS 4 nanoparticles.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, BaS and Cu 2 SnS 3 secondary phases could also be resolved by Raman spectroscopy. 33,34 Fig. 2 shows the Raman spectra of Cu 2 Ba x SnS 4 ( x = 0.2, 0.4, 0.6, 0.8, and 1 M) and Fe-doped Cu 2 Ba 0.9 Fe 0.1 SnS 4 nanoparticles.…”
Section: Resultsmentioning
confidence: 99%
“…Similar types of results were reported for Cd 0.5 Fe 0.5 Se thin films deposited on various substrates. 23 The average crystallite size was estimated by using Scherer's formula 24 λ β θ = D 0.9 cos…”
Section: Resultsmentioning
confidence: 99%
“…The average crystallite size was estimated by using Scherer’s formula where β is the full width at half-maximum, λ is the wavelength of the X-ray source, and θ is the Bragg angle. The microstrain can be calculated from the following relation The dislocation density of the prepared films can be calculated from the following relation Lattice parameter for the tetragonal CZTSe system can be calculated by the following formula and cell volume can be calculated by The calculated crystallite size, dislocation density, microstrain, and lattice parameter values are tabulated in Table .…”
Section: Resultsmentioning
confidence: 99%
“…Still, it has drawbacks such as reproducibility, traces of deposits, masking, and issues with chemicals with varying precipitation rates. 31 Elradaf et al successfully prepared the CuInSnS 4 thin films using a simple spray system with good electrical conductivity, nonlinear optical indices, narrow band gap, and significant absorption coefficient. 32 Moreover, Hameed et al Fabricate the CuInGeSe 4 films and Si/CuInGeSe 4 heterojunction by thermal evaporation.…”
mentioning
confidence: 99%