“…The PASiNP structure remarkably reduces the reflection of Si surface and demonstrates a low average reflection loss of ~2.84% (solid line in Fig. 3) within the same wavelength range, which is far lower than that of pristine Si wafer and previously developed Si micro-/nanostructures, as well as other ARCs [7,8,20,24-27]. In previous reports, the porous Si can reduce the reflection loss to ~5.8% within the wavelength range of 400–1,000 nm and therefore can replace other surface-textured microstructures [20,24-26].…”