2004
DOI: 10.2497/jjspm.51.646
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Fabrication and Microstructual Characteristics of Germanium Spherical Semiconductor Particles by Pulsed Orifice Ejection Method

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Cited by 10 publications
(2 citation statements)
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“…1) Therefore, several groups have intensely investigated the growth of spherical Si crystals using the drop tube method in which the Si melt was ejected through an orifice of $1 mm and droplets solidified into spheres during free fall. [2][3][4] They, however, suffered from the severe polycrystallinity of spherical samples in which grain boundaries act as carrier recombination sites. This is strongly ascribed to the fact that the droplet experienced large undercooling prior to nucleation owing to the elimination of the crucible wall, one of the main heterogeneous nucleation sites.…”
mentioning
confidence: 99%
“…1) Therefore, several groups have intensely investigated the growth of spherical Si crystals using the drop tube method in which the Si melt was ejected through an orifice of $1 mm and droplets solidified into spheres during free fall. [2][3][4] They, however, suffered from the severe polycrystallinity of spherical samples in which grain boundaries act as carrier recombination sites. This is strongly ascribed to the fact that the droplet experienced large undercooling prior to nucleation owing to the elimination of the crucible wall, one of the main heterogeneous nucleation sites.…”
mentioning
confidence: 99%
“…On the other hand, a pulsated orifice ejection method (POEM) allows the preparation of particles with very narrow particle size distribution and very small standard deviation of the mean particle size. So far, several materials with melting points less than 600 K, such as Pb-Sn, Sn-Ag, Bi-Sb have been successfully produced [4][5][6][7]. Recently, Germanium, with the melting point of 1211 K, has also been prepared with this method [8].…”
Section: Introductionmentioning
confidence: 99%