2003
DOI: 10.1088/0953-2048/16/12/021
|View full text |Cite
|
Sign up to set email alerts
|

Fabrication and characterization of NbN, AlN and NbN/AlN/NbN on MgO substrates

Abstract: At ambient substrate temperatures, NbN and AlN thin films as well as NbN/AlN/NbN sandwiches are prepared on single crystal MgO substrates, using direct current (dc) or radio frequency (RF) magnetron sputtering techniques. Excellent single crystal orientations of these structures are revealed by x-ray diffraction and transmission electron microscopy (TEM), while x-ray photoelectron spectroscope (XPS) shows that the stoichiometric composition of the NbN films is 1: 0.9 (Nb:N). Furthermore, AFM (atomic force micr… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

1
3
0

Year Published

2009
2009
2024
2024

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 11 publications
(4 citation statements)
references
References 15 publications
1
3
0
Order By: Relevance
“…Average roughness value of hydrated (1 0 0) surface was about 3 nm, which was almost the same for similar times with that of Delplacke-Ogletree et al [8].…”
Section: Resultssupporting
confidence: 86%
See 1 more Smart Citation
“…Average roughness value of hydrated (1 0 0) surface was about 3 nm, which was almost the same for similar times with that of Delplacke-Ogletree et al [8].…”
Section: Resultssupporting
confidence: 86%
“…1b). MgO single crystal substrates are also frequently used in epitaxial thin film growth [8,9]. Hence degradation of single crystal MgO by moisture related with storage conditions effects structural quality of thin films and devices made on MgO substrates for various microelectronic applications [10,11].…”
Section: Introductionmentioning
confidence: 99%
“…From this perspective, no differences among the four samples could be established. Previous reports [18,[35][36][37] on NbN thin films obtained by PVD or ALD processes demonstrated that the superconducting properties of the NbN thin films are strongly dependent on its lattice parameter; moreover, a larger value leads to a higher Tc. The lattice parameter depends on the chemical composition and vacancies of Nb or N, and the presence of O reduces the lattice parameter [31].…”
Section: Effect Of Annealing In Argonmentioning
confidence: 99%
“…In the experiment, NbN thin films with a thickness of 5-6 nm were deposited on MgO(100) substrate by DC reactive magnetron sputtering under optimized conditions [20] . EBL and RIE were used to form a meander nanowire pattern, as shown in Figure 1.…”
mentioning
confidence: 99%