2015
DOI: 10.1016/j.sna.2015.04.029
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Fabrication and characterisation of a novel smart suspension for micro-CMM probes

Abstract: Citation: ALBLALAIHID, K., KINNELL, P. and LAWES, S., 2015. Fabrication and characterisation of a novel smart suspension for micro-CMM probes.Sensors and Actuators 232, Additional Information:• This paper was accepted for publication in the journal Sensors and Ac- Abstract: In tactile micro coordinate metrology, miniature probing systems are required to allow geometric measurements of miniature, delicate, high precision components. These probing systems typically comprise of a small stylus of only a few mm in… Show more

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Cited by 9 publications
(7 citation statements)
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References 16 publications
(14 reference statements)
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“…The primary point of this probe type is to measure the deformation of the hinge with high sensitivity; therefore, multiple methods, such as optical measurement [60], capacitive sensors [22,60], and silicon membrane sensors [64] have been proposed. This hinge-type probe system has been proposed and developed [70][71][72][73][74][75][76][77][78][79][80][81][82][83][84][85][86], and certain commercially available microprobe systems of this type are available [87][88][89][90][91][92]. By designing structures and materials, hinge-type probe systems can control the stiffness of the probing system.…”
Section: Contact Probing System With Hinge Structurementioning
confidence: 99%
“…The primary point of this probe type is to measure the deformation of the hinge with high sensitivity; therefore, multiple methods, such as optical measurement [60], capacitive sensors [22,60], and silicon membrane sensors [64] have been proposed. This hinge-type probe system has been proposed and developed [70][71][72][73][74][75][76][77][78][79][80][81][82][83][84][85][86], and certain commercially available microprobe systems of this type are available [87][88][89][90][91][92]. By designing structures and materials, hinge-type probe systems can control the stiffness of the probing system.…”
Section: Contact Probing System With Hinge Structurementioning
confidence: 99%
“…In the FEM, for simplicity, the effect of the actuator was modelled as a static displacement. For a range of applied actuator displacements, the stiffness and first two resonant modes of the probe were evaluated using a previously validated modelling process [ 11 ]. Figure 4 shows the simulated axial displacement (do), which is introduced by the piezoelectric actuator, plotted against the frequency and the stiffness of the probing system.…”
Section: The Variable Stiffness Micro-scale Probing Systemmentioning
confidence: 99%
“…Controlling the magnitude of the compressive force, therefore, allows the probe stiffness to be controlled. A full description of the design and working principle behind the variable stiffness probing system is presented elsewhere [ 11 , 12 ].…”
Section: Introductionmentioning
confidence: 99%
“…The thin-wall and low-rigidity characteristics make it difficult to measure with contact instruments. Although the contact probe can be adapted by increasing the contact area to locate on cell walls, the deformation of cell walls is hard to be avoided, which bring about the error of measurement results [8,9]. Therefore, non-contact measurement is more suitable for measuring this material.…”
Section: Introductionmentioning
confidence: 99%