2017
DOI: 10.1117/1.jmm.16.3.033510
|View full text |Cite
|
Sign up to set email alerts
|

Extreme ultraviolet patterning of tin-oxo cages

Abstract: Abstract. We report on the extreme ultraviolet (EUV) patterning performance of tin-oxo cages. These cage molecules were already known to function as a negative tone photoresist for EUV radiation, but in this work, we significantly optimized their performance. Our results show that sensitivity and resolution are only meaningful photoresist parameters if the process conditions are optimized. We focus on contrast curves of the materials using large area EUV exposures and patterning of the cages using EUV interfer… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
74
0
1

Year Published

2017
2017
2023
2023

Publication Types

Select...
8

Relationship

3
5

Authors

Journals

citations
Cited by 47 publications
(83 citation statements)
references
References 25 publications
(36 reference statements)
2
74
0
1
Order By: Relevance
“…[2][3][4] The concepts to be considered, among others, include essentially non-chemically amplied resists (n-CARs) and hybrids. [4][5][6][7][8][9][10][11][12][13][14][15] The design paradigm has to incorporate the basic principles of conventional resists superimposed with the specic requirements of EUVL for attaining the lower nodes. 12,15,16 The interaction of the resist thin lms with high energy EUV photons (13.5 nm) is a very complex process triggered by EUV radiation that breaks the chemical bonds and simultaneously produces ablation and a high yield of secondary electrons.…”
Section: Introductionmentioning
confidence: 99%
“…[2][3][4] The concepts to be considered, among others, include essentially non-chemically amplied resists (n-CARs) and hybrids. [4][5][6][7][8][9][10][11][12][13][14][15] The design paradigm has to incorporate the basic principles of conventional resists superimposed with the specic requirements of EUVL for attaining the lower nodes. 12,15,16 The interaction of the resist thin lms with high energy EUV photons (13.5 nm) is a very complex process triggered by EUV radiation that breaks the chemical bonds and simultaneously produces ablation and a high yield of secondary electrons.…”
Section: Introductionmentioning
confidence: 99%
“…The tin-oxo cage [(nBuSn) 12 O 14 (OH) 6 ] 2+ (X -) 2 , where Xdenotes a counterion, was prepared according to previously described methods [10,11,19], starting from the commercially available nBuSnOOH (Sigma Aldrich) and p-toluene sulfonic acid (Sigma Aldrich) to yield [(nBuSn) 12 O 14 (OH) 6 ](pTos) 2 which was then exchanged with aqueous base to yield [(nBuSn) 12 O 14 (OH) 6 ](OH) 2 which we call TinOH. NMR and IR spectra agreed with the literature.…”
Section: Methodsmentioning
confidence: 99%
“…An example of such a material is the tin-oxo cage (see Fig. 1) [9][10][11]. This cage consists of a tin-oxo core with 12 organic groups (in the present case nbutyl chains) attached to the tin atoms.…”
Section: Introductionmentioning
confidence: 99%
“…However, the resulting silicon oxide nanostructures offer limited chemical reactivity, so that next‐generation resists with added functionalities (e. g. redox‐ or acid/base‐reactivity) are required to open new application scenarios, such as catalysis, or integration in electrical circuits. Pioneering studies in this direction have developed alternative resists with (photo)catalytic or redox‐properties based on metal‐oxide organic clusters, [17] metal‐oxide cores, [18] as well as molecular metal oxides (polyoxometalates, POMs) [15a,19] …”
Section: Figurementioning
confidence: 99%