The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.
DOI: 10.1109/mwscas.2002.1187219
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Extraction of electrical parameters of floating gate devices for circuit analysis, simulation, and design

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Cited by 12 publications
(15 citation statements)
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“…The drain-gate voltage at the diode connected MI-FGMOS transistor becomes (19) Equation (19) is in the form required by (17), and it is also in the form of the general expression of the algorithm (10). This validates that the proposed implementation yields an algorithm that can be mapped directly into a transistor level implementation.…”
Section: B Siso Analog Circuit Implementationsupporting
confidence: 52%
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“…The drain-gate voltage at the diode connected MI-FGMOS transistor becomes (19) Equation (19) is in the form required by (17), and it is also in the form of the general expression of the algorithm (10). This validates that the proposed implementation yields an algorithm that can be mapped directly into a transistor level implementation.…”
Section: B Siso Analog Circuit Implementationsupporting
confidence: 52%
“…This allow us to include a capacitance between the FG and the n well. Also, we are able to model the intrinsic charge stored in the FG capacitor [19]. This charge can be trapped during the fabrication process, or can be externally programmed by the user.…”
Section: Simulation Resultsmentioning
confidence: 99%
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“…MIFG-MOS transistor was modelled as described in [6] with a capacitors of 2 pF. Figure 4 plots the variation of the output current according to the differential input voltage for various values of the parameter A.…”
Section: Simulations Resultsmentioning
confidence: 99%
“…There are some structures that have become popular within the analog de-signer community. The most popular modeling structures are a "coupling" model developed by Mondragon-Torres et al [7] and a synapse model shown by Rahimi et al [8] and Gray et al [9]. The coupling model in [10] focuses mainly on modeling how the parasitic capacitances effect the operational characteristics of the device.…”
Section: Previous Modeling Attemptsmentioning
confidence: 99%