Exploring Interfaces Through Synchrotron Radiation Characterization Techniques: A Graphene Case (Adv. Funct. Mater. 42/2022)

Ding, Yiran; Shi, Haiwen; Zeng, Mengqi; Fu, Lei

doi:10.1002/adfm.202270233

Cited by 1 publication

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…[ 17 ] These systems are promising for the growth of high‐quality materials [ 18 ] but, at the same time, can be very demanding experimentally. [ 19 ] They must be adapted to high operation temperatures, high material evaporation, and exposure to a mixture of reactive gases at atmospheric pressure. In addition, they are confined to a limited‐size sample holder resulting in a significant wetting angle with the support, and they demand extreme surface sensitivity.…”

Section: Introductionmentioning

confidence: 99%

Employing Surface Curvature for Spatially Resolved X‐Ray Reflectivity: Graphene Domains on Liquid Copper

Belova

Jankowski

Saedi

et al. 2023

Adv Materials Inter

View full text Add to dashboard Cite

Here the possibility of utilizing X‐ray reflectivity for visualization with ≈µm spatial resolution of a surface with a heterogeneous electron density due to a partial coverage by another nanometrically thin material is demonstrated. It requires the sample to be convexly bent, thus reflecting the collimated incident beam onto a magnified image recorded by a position‐sensitive detector. By the use of a small, intense, and parallel beam such as provided by the most recent synchrotron sources, one can record such spatially resolved X‐ray reflectivity with 0.1–1 kHz frame rate. The use of the method for in situ, time‐resolved characterization of single‐layer graphene domains during their chemical vapor deposition on a naturally curved surface of a liquid copper drop is demonstrated. This method can follow the growth kinetics, including the coverage ratio, 2D crystal (flake) sizes, and distances between flakes. By taking a single scan, the individual X‐ray reflectivity curves can be reconstructed, of both covered and noncovered parts of the surface, allowing to deduce the corresponding electron density profiles perpendicular to the surface. The technique has a promising perspective for in situ study of 2D materials, ultrathin films, and self‐assemblies on liquid as well as solid surfaces.

show abstract

Section: Introductionmentioning

confidence: 99%