2015
DOI: 10.1021/acs.jpcc.5b07485
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Experiments and Consideration about Surface Nonstoichiometry of Few-Layer MoS2 Prepared by Chemical Vapor Deposition

Abstract: A detailed chemical and structural characterization of the 2H-MoS 2 prepared by chemical vapor-phase method is presented. The nanosized MoS 2 (five to eight layers and the lateral planes area from 17 to 55 nm) was confirmed by atomic force microscopy, X-ray powder diffraction, and Raman spectroscopy. Here the main attention was given to active edge sites and vacancy defects in the nanosized MoS 2 .To settle the problem, we pioneered the application of an effective combination of adequate techniques such as hig… Show more

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Cited by 22 publications
(11 citation statements)
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“…The peak at 533.5 eV can be attributed to the adsorbed water molecules while the peak at 532.5 eV indicates the presence of sulfate or carboxylate, which is common in sulfides as previous reports indicate. [ 42,43 ]…”
Section: Resultsmentioning
confidence: 99%
“…The peak at 533.5 eV can be attributed to the adsorbed water molecules while the peak at 532.5 eV indicates the presence of sulfate or carboxylate, which is common in sulfides as previous reports indicate. [ 42,43 ]…”
Section: Resultsmentioning
confidence: 99%
“…The FT-IR spectrum of coating is shown in Fig. 12 [14][15][16]. Using the diffraction peaks (0 0 3) (2θ = 14.05°) and (1 0 1) (2θ = 32.80°) an average grain was calculated for each coating at different sulfurizing temperature.…”
Section: Fig 7 Ln D Vs 1/t For Diffusion Layermentioning
confidence: 99%
“…Since the active surface oxygen vacancies and less-coordinated morphological sites are best determined through their different solubility in the acidic solvents, differential dissolution (DD) [14][15][16]56] was carried out in the specially induced dynamic regime with progressively increasing concentration of solvent, i.e., its chemical potential µ, that provided sequentially transfer of the phases into solution (Figure 1a). The solvent went over a film with a constant velocity, dissolving the~5 Å/cm 2 layer, and each solvent portion was fed by peristaltic pumps with a frequency of 1 s to the analyzer detector, an inductively coupled plasma atomic emission spectrometer (ICP AES, model 262477-364A, Baird, Zoeterwoude, Holland).…”
Section: Methodsmentioning
confidence: 99%
“…Ultraviolet photoelectron spectroscopy, optics and reflection electron energy loss spectroscopy are also sensitive to the hydroxylation effect and cannot detect selectively individual types of the F defects in the presence of the impurity oxygen atoms [42,48,52,54]. In such a situation, preference was given to differential dissolution (DD) method which inherently performs at once the phase and chemical analyses of the simple and complex films as it was shown before in [14][15][16]55,56]. Combining DD data with those obtained by XRD, scanning electron microscopy (SEM) and measuring SEEC of the films, we were in the certainty to get the exhaustive structural, chemical and phase information and to explain what the phase component and in what manner contributes in enhancement of SEE properties.…”
Section: General Trendsmentioning
confidence: 99%