1983
DOI: 10.1109/t-ed.1983.21191
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Experimental observation of avalanche multiplication in charge-coupled devices

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Cited by 36 publications
(24 citation statements)
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“…T HE ELECTRON multiplying charge-coupled devices (EMCCDs) use impact ionization to provide high gain in the charge domain [1]. This enables performance with an equivalent input noise of much less than 1 rms electron at pixel rates up to and beyond those required for TV imaging applications.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…T HE ELECTRON multiplying charge-coupled devices (EMCCDs) use impact ionization to provide high gain in the charge domain [1]. This enables performance with an equivalent input noise of much less than 1 rms electron at pixel rates up to and beyond those required for TV imaging applications.…”
Section: Introductionmentioning
confidence: 99%
“…A noise factor can be defined by the following [4]: (1) where is the mean gain and and are the variances of the input and output signals, respectively. If the gain process adds no noise, then the noise factor will be unity.…”
Section: Introductionmentioning
confidence: 99%
“…The solid state EM register was appended in between the normal serial register and the final detection nodes (Jerram et al 2001). A concept, viz., impact ionization, in silicon was utilized to provide gain in the charge domain of an EMCCD (Madan et al 1983). This was achieved by operating the gain register at high clock voltage to encourage avalanche multiplication.…”
Section: Emccd Camera and Control Softwarementioning
confidence: 99%
“…The electron multiplying charge coupled device (EMCCD), such as the e2v L3CCD, uses impact ionization in silicon to provide gain in the charge domain 1 . This enables performance with an input equivalent noise of less than 1 rms electron at pixel rates up to and beyond those required for TV imaging applications.…”
Section: Introductionmentioning
confidence: 99%