“…The phenomenon of exchange bias coupling between antiferromagnetic (AFM) and ferromagnetic (FM) thin films, first reported by Meiklejohn and Bean [1,2], is now of major importance for both magnetic recording read heads and for data storage applications such as magnatic random access memory (MRAM) [3][4][5]. The exchange coupling between AFM/FM films, which has been shown to be primarily an interfacial phenomenon, is dependent on the microstructural characteristics which include AFM orientation [6], crystal texture [7], interfacial roughness [5,7], grain size [8], impurities, etc.…”