1975
DOI: 10.1364/ao.14.000142
|View full text |Cite
|
Sign up to set email alerts
|

Evaluation of Large Aberrations Using a Lateral-Shear Interferometer Having Variable Shear

Abstract: A variable shear lateral shearing interferometer consisting of two holographically produced crossed diffraction gratings is used to test nonrotationally symmetric wavefronts having aberrations greater than 100 wavelengths and slope variations of more than 400 wavelengths/diameter. Comparisons are made with results of Twyman-Green interferometric tests for wavefront aberrations of up to thirty wavelengths. The results indicate that small wavefront aberrations can be measured as accurately with the lateral-shear… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
35
0

Year Published

1982
1982
2022
2022

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 135 publications
(35 citation statements)
references
References 8 publications
0
35
0
Order By: Relevance
“…In principle, one could obtain the wave front W according to the method of Rimmer and Wyant 23 by numerically integrating the difference V for two shears in orthogonal directions. This would also allow using the expansion in Ref.…”
Section: Phase Reconstruction and Depth Resolution 31 Signal Model Amentioning
confidence: 99%
“…In principle, one could obtain the wave front W according to the method of Rimmer and Wyant 23 by numerically integrating the difference V for two shears in orthogonal directions. This would also allow using the expansion in Ref.…”
Section: Phase Reconstruction and Depth Resolution 31 Signal Model Amentioning
confidence: 99%
“…Other implementations vary the rotation angle between a series of crossed gratings [20,21] or rely on rotation within Talbot self-imaging to alter the region of overlap [22]. Mechanical motion and tight tolerances associated with these techniques are not ideal for integrated devices.…”
Section: Variable Lsi Sensormentioning
confidence: 99%
“…Because total wavefront Let us review the coefficient transformation approach. The following material is extracted from Rimmer and Wyant (1975). where N. is the digitized error.…”
Section: Lateral Shearing Interferogram Analysismentioning
confidence: 99%
“…Deleting test optics error (Parks, 1978) 1 2 2. Lateral shearing interferogram analysis (Rimmer and Wyant, 1975) 3. Ritchey-Common test (Shu, Parks and Shannon, 1981) 4.…”
Section: Introductionmentioning
confidence: 99%