A new method of white-light fringes analysis called multi-spectral phase-crossing detection is presented. The technique is based on analysis of phase distributions of at least two white-light interferograms recorded simultaneously by detectors with mutually different spectral sensitivities. The analysis of the phase crossing of multiple white-light interferograms with different spectral bands gives us the possibility to find the position of zero optical path difference without ambiguity. The theoretical background and measurement results are presented.