Eighth International Symposium on Laser Metrology 2005
DOI: 10.1117/12.611644
|View full text |Cite
|
Sign up to set email alerts
|

Multispectral phase-crossing white-light interferometry

Abstract: A new method of white-light fringes analysis called multi-spectral phase-crossing detection is presented. The technique is based on analysis of phase distributions of at least two white-light interferograms recorded simultaneously by detectors with mutually different spectral sensitivities. The analysis of the phase crossing of multiple white-light interferograms with different spectral bands gives us the possibility to find the position of zero optical path difference without ambiguity. The theoretical backgr… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2011
2011
2023
2023

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
references
References 7 publications
0
0
0
Order By: Relevance