Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements

Mubarak, Faisal; Romano, Raffaele; Spirito, M.

doi:10.1109/arftg.2015.7381475

Cited by 14 publications

(3 citation statements)

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In [7], an active 45 interferometric method was introduced that uses an injected 46 signal, controlled by an I/Q mixer connected to a low-noise 47 amplifier, for the cancelation of the reflection signal. In [8], 48 an evaluation of the measurement resolution of a VNA, 49 based on the setup of [7], was presented but only results 50 for impedances up to 500 were demonstrated. Both the 51 passive and active methods introduced, require complicated 52 measurement setups, potentially increasing the measurement 53 uncertainty.…”

mentioning

confidence: 99%

An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Votsi

Aaen

et al. 2017

IEEE Microw. Wireless Compon. Lett.

View full text Add to dashboard Cite

Nano-scale devices and high power transistors\ud present extreme impedances, which are far removed from the\ud 50-Ω reference impedance of conventional test equipment,\ud resulting in a reduction in the measurement sensitivity as\ud compared with impedances close to the reference impedance. This\ud letter describes a novel method based on active interferometry\ud to increase the measurement sensitivity of a VNA for measuring\ud such extreme impedances, using only a single coupler. The\ud theory of the method is explained with supporting simulation.\ud An interferometry-based method is demonstrated for the\ud first time with on-wafer measurements, resulting in an\ud improved measurement sensitivity for extreme impedance device\ud characterization of up to 9%

show abstract

mentioning

confidence: 99%

An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Votsi

Aaen

et al. 2017

IEEE Microw. Wireless Compon. Lett.

View full text Add to dashboard Cite

show abstract

“…In [19], the approach is limited to the noise assessment in matched conditions (i.e., ≈ 0) and no solution is offered for highly mismatched cases (i.e., > 0.9). In [3] and [20] improved noise partitioning methods are proposed, giving a frequencydependent noise evaluation over the entire -region. However, these approaches only allow for a noise evaluation for the magnitude component, neglecting the impact of noise in the phase.…”

Section: Noise In S-parameter Measurementsmentioning

confidence: 99%

“…measurement noise and high accuracy is only achieved when measuring devices under test (DUTs) with impedance levels close to the VNA instrument impedance (Z 0 ), commonly designed to be 50 . When the DUT impedance deviates from Z 0 , the VNA measurement sensitivity degrades progressively [3]- [5] presenting up to two orders of magnitude lower resolution in highly mismatched conditions, shown in Fig. 1.…”

mentioning

confidence: 99%

Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Mubarak

Romano²,

Galatro³

et al. 2019

IEEE Trans. Microwave Theory Techn.

Self Cite

View full text Add to dashboard Cite

This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how the VNA measurement noise performance is enhanced through implementation of a high-speed, broadband, active RF interferometer module. The presented VNA noise model provides a solid framework, benchmarked by measurement data, to analyze existing RF interferometer approaches. The performance improvement of the proposed interferometer implementation is then benchmarked in terms of magnitude and phase stability of the renormalized impedance level. A test bench employing the novel add-on RF interferometer module is presented and demonstrated to achieve high-speed cancellation of the scattered wave over a broad frequency band. The first experiment shows ultralow noise in a 1-18 GHz broadband measurement of co-planar waveguide 0.5-and 5-k impedance standards. Employing the proposed hardware setup improves the noise uncertainty for the 5-k impedance standard by a factor of 8 and 20 at 1 and 18 GHz, respectively. In the second experiment, a factor of 2 height-resolution enhancement is achieved in a scanning microwave microscope when the RF interferometer module is added to the instrument.

show abstract

Extreme Impedance Measurements

Wallis¹,

Kaboš²

2017

Measurement Techniques for Radio Frequency Nanoelectronics

View full text Add to dashboard Cite

Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements

Cited by 14 publications

References 1 publication

An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Extreme Impedance Measurements

Contact Info

Product

Resources

About