An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Votsi, Haris; Li, Chong; Aaen, Peter H.; Ridler, N M

doi:10.1109/lmwc.2017.2750086

Cited by 7 publications

(9 citation statements)

References 9 publications

(7 reference statements)

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“…This can be either an IQ-steering technique [15] shown in Fig. 4(b) or a second, phase coherent, source [16] as shown in Fig. 4(c).…”

Section: B Active Methodsmentioning

confidence: 99%

“…The analysis of the Section II clearly demonstrates, through the noise analysis of (1), that the zero-reflected wave condition provides the smallest noise in S-parameter measurements of a generic DUT. To reach this wave condition, several RF interferometric techniques have been developed [13]- [16] all aiming at cancelling the scattered b dut -wave generated by the (high | dut |) DUT through the injection of an additional, compensating the b int -wave signal. Fig.…”

Section: Comparison Of Interferometric Techniquesmentioning

confidence: 99%

“…Various techniques have been presented in the literature [13]- [16] to cancel the device generated b-wave by 0018-9480 © 2018 IEEE. Translations and content mining are permitted for academic research only.…”

mentioning

confidence: 99%

“…In [15] and [16], the b int -wave is generated using active circuitry, either via a single-source technique with IQ-mixer steering configuration [15] or with phase-controllable dual synthesizers [16]. Both approaches allow to achieve high sensitivity over a broadband frequency range.…”

mentioning

confidence: 99%

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Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Mubarak

Romano²,

Galatro³

et al. 2019

IEEE Trans. Microwave Theory Techn.

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This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how the VNA measurement noise performance is enhanced through implementation of a high-speed, broadband, active RF interferometer module. The presented VNA noise model provides a solid framework, benchmarked by measurement data, to analyze existing RF interferometer approaches. The performance improvement of the proposed interferometer implementation is then benchmarked in terms of magnitude and phase stability of the renormalized impedance level. A test bench employing the novel add-on RF interferometer module is presented and demonstrated to achieve high-speed cancellation of the scattered wave over a broad frequency band. The first experiment shows ultralow noise in a 1-18 GHz broadband measurement of co-planar waveguide 0.5-and 5-k impedance standards. Employing the proposed hardware setup improves the noise uncertainty for the 5-k impedance standard by a factor of 8 and 20 at 1 and 18 GHz, respectively. In the second experiment, a factor of 2 height-resolution enhancement is achieved in a scanning microwave microscope when the RF interferometer module is added to the instrument.

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“…This can be either an IQ-steering technique [15] shown in Fig. 4(b) or a second, phase coherent, source [16] as shown in Fig. 4(c).…”

Section: B Active Methodsmentioning

confidence: 99%

Section: Comparison Of Interferometric Techniquesmentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

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Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Mubarak

Romano²,

Galatro³

et al. 2019

IEEE Trans. Microwave Theory Techn.

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“…In 2015, an I/Q-mixer-based interferometric technique is developed for speed operation and noise reduction [19]. In 2017, an active interferometric method using the internal sources of a multiport VNA and an external coupler is introduced [20]. These studies have proven that RF interferometric techniques are candidates to tackle the problem of impedance mismatch in a variety of applications.…”

Section: Brief State Of the Artmentioning

confidence: 99%

Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization

Haddadi

Okada

Daffe

et al. 2019

2019 IEEE MTT-S International Microwave Symposium (IMS)

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A novel active microwave interferometric technique is implemented on a multiport vector network analyzer for renormalizing the reference impedance 50 Ohms into any desired complex impedance. The resulting measured reflection coefficient around the new reference impedance is around zero, resulting in high measurement sensitivity. The method proposed avoids any external component commonly found in interferometric setups. In addition, a zeroing process including vector calibration is developed for broad frequency range and requires only a software procedure to be implemented in the system framework.

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Improved measurement techniques for high-power transistor modeling

Wang

Huang

Fang

et al. 2020

Review of Scientific Instruments

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Measurement for modeling of the high-power transistors is difficult due to its high-power and low-impedance characteristics. In this paper, novel methods and devices were designed and applied to achieve precise measurements of the high-power transistors. Fixtures capable of withstanding high voltage and current were designed to replace traditional radio frequency (RF) probes for higher power capacity. To reduce the impact of capacitive and inductive components of traditional bias tees on the rising/falling edge, two wideband 90° hybrid couplers that were connected back-to-back were designed for pulsed measurements. The measurement system of stable S-parameters with the Vector Network Analyzer (VNA) was reported, which could protect the devices and laboratory equipment from damage of self-oscillation. Application of several innovative approaches enabled accurate I–V characteristic and S-parameters measurements of high-power transistors in DC or pulsed mode. Experimental results of a 30 W gallium nitride high-electron-mobility transistor verified the validity.

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An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Cited by 7 publications

References 9 publications

Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization

Improved measurement techniques for high-power transistor modeling

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