Europium monoxide nanocrystalline thin films with high near-infrared transparency

Mariscal, Antonio Joaquín Franco; Quesada, A.; Martín-Luengo, Aitana Tarazaga; García, M. A.; Bonanni, A.; Fernández, J.F.; Serna, Rosalía

doi:10.1016/j.apsusc.2018.06.180

Cited by 18 publications

(14 citation statements)

References 50 publications

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“…Furthermore, the fast 3 d photoelectrons create plasmon excitation structures observed as broad peaks at BE ∼1146 eV and ∼1170 eV [ 34 ]. The XPS spectra shown in Figure 6 prove the mixed valency of Eu cations as they agree well with previous work reported for Eu

and Eu

[ 34 , 36 , 39 , 40 , 41 ]. Moreover, the average atomic ratio of the Eu

to Eu

in the 3 d

and 3 d

is consistent with the values reported in Eu-doped ZnO [ 42 ] and Eu-doped GaN nanowires [ 43 ].…”

Section: Resultssupporting

confidence: 90%

“…All spectra in Figure 6 show the spin-orbit coupling (SOC) components, 3 d

and 3 d

, for Eu

and Eu

separated by

eV, which agrees with previously reported values [ 34 , 36 , 38 ]. They also show additional peaks at slightly higher binding energy (BE) to the SOC peaks for the Eu

and Eu

.…”

Section: Resultssupporting

confidence: 90%

“…The 4 d XPS spectra have a complicated structure (not shown) due to the strong unfilled 4 f

d hole interaction, whereas the 3 d states have a weaker multiplet splitting and broader photoexcitation cross-section. Therefore, the latter is usually used to analyse the Eu XPS spectra and better estimate the Eu initial valence [ 34 , 35 , 36 , 37 ].…”

Section: Resultsmentioning

confidence: 99%

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Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene

et al. 2021

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We report the growth, structural and magnetic properties of the less studied Eu-oxide phase, Eu3O4, thin films grown on a Si/SiO2 substrate and Si/SiO2/graphene using molecular beam epitaxy. The X-ray diffraction scans show that highly textured crystalline Eu3O4(001) films are grown on both substrates, whereas the film deposited on graphene has a better crystallinity than that grown on the Si/SiO2 substrate. The SQUID measurements show that both films have a Curie temperature of ∼5.5±0.1 K, with a magnetic moment of ∼320 emu/cm3 at 2 K. The mixed valence of the Eu cations has been confirmed by the qualitative analysis of the depth-profile X-ray photoelectron spectroscopy measurements with the Eu2+:Eu3+ ratio of 28:72. However, surprisingly, our films show no metamagnetic behaviour as reported for the bulk and powder form. Furthermore, the microscopic optical images and Raman measurements show that the graphene underlayer remains largely intact after the growth of the Eu3O4 thin films.

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and Eu

[ 34 , 36 , 39 , 40 , 41 ]. Moreover, the average atomic ratio of the Eu

to Eu

in the 3 d

and 3 d

is consistent with the values reported in Eu-doped ZnO [ 42 ] and Eu-doped GaN nanowires [ 43 ].…”

Section: Resultssupporting

confidence: 90%

“…All spectra in Figure 6 show the spin-orbit coupling (SOC) components, 3 d

and 3 d

, for Eu

and Eu

separated by

eV, which agrees with previously reported values [ 34 , 36 , 38 ]. They also show additional peaks at slightly higher binding energy (BE) to the SOC peaks for the Eu

and Eu

.…”

Section: Resultssupporting

confidence: 90%

“…The 4 d XPS spectra have a complicated structure (not shown) due to the strong unfilled 4 f

Section: Resultsmentioning

confidence: 99%

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Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene

et al. 2021

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“…The 4d XPS spectra have a complicated structure (not shown) due to the strong unfilled 4f −4d hole interaction, whereas the 3d states have a weaker multiplet splitting and broader photoexcitation cross-section. Therefore, the latter is usually used to analyse the Eu XPS spectra and obtain a better estimation of the Eu initial valence [8][9][10][11]. All spectra in Figure 6 show the spin-orbit coupling (SOC) components, 3d 5/2 and 3d 3/2 , for Eu 2+ and Eu 3+ separated by ∆ ∼ 29.5 eV, which agrees with previously reported values [8,10,12].…”

Section: Xpssupporting

confidence: 86%

Growth and Characterisation Studies of Eu$_3$O$_4$ Thin Films Grown on Si/SiO$_2$ and Graphene

Aboljadayel,

Ionescu,

Burton

et al. 2021

Preprint

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We report the growth, structural and magnetic properties of the less studied Eu-oxide phase, Eu 3 O 4 , thin films grown on a Si/SiO 2 substrate and Si/SiO 2 /graphene using molecular beam epitaxy. The X-ray diffraction scans show that highly-textured crystalline Eu 3 O 4 (001) films are grown on both substrates, whereas the film deposited on graphene has a better crystallinity than that grown on the Si/SiO 2 substrate. The SQUID measurements show that both films have a Curie temperature of 5.5 ± 0.1 K, with a magnetic moment of 0.0032 emu/g at 2 K. The mixedvalency of the Eu cations has been confirmed by the qualitative analysis of the depth-profile Xray photoelectron spectroscopy measurements with the Eu 2+ : Eu 3+ ratio of 28 : 72. However, surprisingly, our films show no metamagnetic behaviour as reported for the bulk and powder form.Furthermore, the Raman spectroscopy scans show that the growth of the Eu 3 O 4 thin films has no damaging effect on the underlayer graphene sheet. Therefore, the graphene layer is expected to retain its properties.

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“…In this regard, we have recently shown the successful preparation of transparent nanocrystalline EuO thin films in the near infrared, which expands the potential for optical applications of this material. 19 However, the potential of light emission of nano-EuO x films has not been yet addressed, although ions are generally used as dopant for phosphors in lighting application because of their extraordinary emission properties. In previous works, the tuning of the luminescence europium-doped oxides, for example, silicon oxides 20 and CaYAlO 4 , 21 has been investigated as a function of the annealing conditions.…”

Section: Introductionmentioning

confidence: 99%

Photoluminescence and Stoichiometry Correlation in Nanocrystalline EuO_x Thin Films: Tunable Color Emission

et al. 2020

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The development of broadband and ultracompact optoelectronic devices relies on the possibility of fabricating bright and tunable emitters at the nanoscale. Here, we show emission from EuO x (1 ≤ x < 1.4) thin films on silicon formed by nanocrystals with average sizes in the range of 5 nm. The photoluminescence emission of the nano-EuO x films is tunable as a function of the oxygen concentration changing from a green broadband Eu 2+ -related emission to a narrow red Eu 3+ -related emission. To reach these results has been instrumental through the use of a new methodology specially designed to achieve high-quality europium oxide films whose compositional properties are controlled by the growth base pressure and preserved thanks to a chemically stable and transparent cover layer of Al 2 O 3 . Our findings confirm the outstanding potential of nanostructured EuO x films as “one-compound” optical elements with tunable emission properties for their implementation in integrated silicon-based devices.

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Europium monoxide nanocrystalline thin films with high near-infrared transparency

Cited by 18 publications

References 50 publications

Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene

Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene

Growth and Characterisation Studies of Eu$_3$O$_4$ Thin Films Grown on Si/SiO$_2$ and Graphene

Photoluminescence and Stoichiometry Correlation in Nanocrystalline EuO_x Thin Films: Tunable Color Emission

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Europium monoxide nanocrystalline thin films with high near-infrared transparency

Cited by 18 publications

References 50 publications

Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene

Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene

Growth and Characterisation Studies of Eu$_3$O$_4$ Thin Films Grown on Si/SiO$_2$ and Graphene

Photoluminescence and Stoichiometry Correlation in Nanocrystalline EuOx Thin Films: Tunable Color Emission

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Photoluminescence and Stoichiometry Correlation in Nanocrystalline EuO_x Thin Films: Tunable Color Emission