2008
DOI: 10.1016/j.sse.2008.05.008
|View full text |Cite
|
Sign up to set email alerts
|

ESD protection design for I/O libraries in advanced CMOS technologies

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2010
2010
2017
2017

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 12 publications
(1 citation statement)
references
References 21 publications
(35 reference statements)
0
1
0
Order By: Relevance
“…8. These input diodes are needed, especially in deep-submicron technologies where the prototype can be destroyed easily due to ESD.They are designed for this purpose following a layout strategy for high-frequency I/O pads proposed in [9]. They have minimum size for a reduced parasitic capacitance (72 fF), thus protecting in an efficient way but with no visible effect on the frequency response.…”
Section: Resultsmentioning
confidence: 99%
“…8. These input diodes are needed, especially in deep-submicron technologies where the prototype can be destroyed easily due to ESD.They are designed for this purpose following a layout strategy for high-frequency I/O pads proposed in [9]. They have minimum size for a reduced parasitic capacitance (72 fF), thus protecting in an efficient way but with no visible effect on the frequency response.…”
Section: Resultsmentioning
confidence: 99%