Hexagonal boron nitride (h-BN) is a layered two-dimensional material with properties that make it promising as a dielectric in various applications. We report the growth of h-BN films on Ni foils from elemental B and N using molecular beam epitaxy. The presence of crystalline h-BN over the entire substrate is confirmed by Raman spectroscopy. Atomic force microscopy is used to examine the morphology and continuity of the synthesized films.A scanning electron microscopy study of films obtained using shorter depositions offers insight into the nucleation and growth behavior of h-BN on the Ni substrate. The morphology of h-BN was found to evolve from dendritic, starshaped islands to larger, smooth triangular ones with increasing growth temperature.The previous decade has seen extensive research efforts focused on the novel properties of two-dimensional materials and their associated potential applications. This surge in interest was instigated by the isolation of monolayer graphene for the first time, 1 and has rapidly spread to other materials. 2 One such material, hexagonal boron nitride (h-BN), has been the subject of particular attention.This intense research interest has been driven by the suitability of h-BN for integration into heterostructures with other two-dimensional materials, such as graphene. 3 The first, and perhaps most intuitive way to integrate h-BN and graphene is in vertically stacked heterostructures. In this configuration, the h-BN acts as an insulating layer between electrically active graphene sheets, as well as offering the capability to tune the properties of the graphene layers through moiré effects and other interlayer interactions. 4 This scheme is enhanced by the atomically smooth surface and homogeneous charge potential offered by h-BN, as illustrated by the order of magnitude higher charge a) Author's current address: