Abstract:Thin films of SiC were deposited using DC, RF and pulsed sputtering of a hollow cathode. The majority of the films were deposited using RF sputtering at temperatures ranging from 610 to 858 o C. Initial films were deposited onto Si substrates in order to determine deposition rates, film uniformity, and film composition. The introduction of a rotating substrate holder greatly improved the film thickness and composition uniformity. The samples were characterized using X-ray diffraction (XRD), Raman spectroscopy,… Show more
“…Hollow cathode deposition of other semiconductors in this laboratory has been discussed in previous works [8][9][10] and the vacuum system used in this experiment has been described elsewhere [9].…”
Thin films of SiC have been deposited using a hollow cathode sputtering technique. Several methods have been used including DC, RF, and pulsed sputtering. The films reported here have been deposited using DC and pulsed sputtering.
“…Hollow cathode deposition of other semiconductors in this laboratory has been discussed in previous works [8][9][10] and the vacuum system used in this experiment has been described elsewhere [9].…”
Thin films of SiC have been deposited using a hollow cathode sputtering technique. Several methods have been used including DC, RF, and pulsed sputtering. The films reported here have been deposited using DC and pulsed sputtering.
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