2006
DOI: 10.1063/1.2171932
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Enhancement of magnetoresistance in [Pd∕Co]N∕Cu∕Co∕[Pd∕Co]N∕FeMn spin valves

Abstract: The dependences of the stack number and Co and Cu thicknesses on magnetoresistance, and perpendicular exchange biasing in the [Pd∕Co]×N1∕Cu∕Co∕[Pd∕Co]×N2∕FeMn spin valves, were investigated. The magnetoresistance ratio of the spin valves with N1=4 and N2=2 was above 5% for the Cu between 1.5 and 2.5nm, and the exchange-biasing field (Hex) was increased to 600Oe. When the Co thickness over the Cu layer was increased from 0.48to1.28nm, the ratio likewise rose to 7.4% due to the strengthened spin-dependent scatte… Show more

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Cited by 17 publications
(1 citation statement)
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“…For the thinnest spacer ͑0.8 nm͒ we observe about 2% MR, which rapidly increases with Cu spacer thickness to a maximum value of around 5% at t Cu = 2.4 nm, and then again decreases for thicker Cu spacer. We note that this thickness dependence is similar to what is observed in in-plane and out-of-plane spin valves [14][15][16] and pseudo spin valves. 17,18 We also extract the overall sample resistance ͑R͒ in the parallel state taken from the value measured at Ϫ14 kOe applied field.…”
Section: Resultssupporting
confidence: 84%
“…For the thinnest spacer ͑0.8 nm͒ we observe about 2% MR, which rapidly increases with Cu spacer thickness to a maximum value of around 5% at t Cu = 2.4 nm, and then again decreases for thicker Cu spacer. We note that this thickness dependence is similar to what is observed in in-plane and out-of-plane spin valves [14][15][16] and pseudo spin valves. 17,18 We also extract the overall sample resistance ͑R͒ in the parallel state taken from the value measured at Ϫ14 kOe applied field.…”
Section: Resultssupporting
confidence: 84%