2011
DOI: 10.1021/nl201358y
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Enhanced Transport and Transistor Performance with Oxide Seeded High-κ Gate Dielectrics on Wafer-Scale Epitaxial Graphene

Abstract: We explore the effect of high-κ dielectric seed layer and overlayer on carrier transport in epitaxial graphene. We introduce a novel seeding technique for depositing dielectrics by atomic layer deposition that utilizes direct deposition of high-κ seed layers and can lead to an increase in Hall mobility up to 70% from as-grown. Additionally, high-κ seeded dielectrics are shown to produce superior transistor performance relative to low-κ seeded dielectrics and the presence of heterogeneous seed/overlayer structu… Show more

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Cited by 106 publications
(98 citation statements)
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“…14,15 Indeed, several electronic transport measurements on graphene or atomically thin material have successfully revealed mobility enhancement though change in the dielectric environment. [16][17][18][19] However, a systematic study of the dielectric environment effect on the carrier mobility of the GDLS has not been performed yet.…”
Section: Kazuhiro Hosono and Katsunori Wakabayashimentioning
confidence: 99%
“…14,15 Indeed, several electronic transport measurements on graphene or atomically thin material have successfully revealed mobility enhancement though change in the dielectric environment. [16][17][18][19] However, a systematic study of the dielectric environment effect on the carrier mobility of the GDLS has not been performed yet.…”
Section: Kazuhiro Hosono and Katsunori Wakabayashimentioning
confidence: 99%
“…The carrier mobility in 1-D and 2-D semiconductor nanostructures is sensitive to permittivity, 77 as is that of single-layer graphene transistors in different dielectric environments. 78,79 The catalytic activities of surface-modified and unmodified Co 3 O 4 /SBA-15 nanocomposites were also measured for comparison ( Figure 8 and Table 3). The concentration of O 2 produced using Co 3 O 4 /SBA-15 nanocomposites reached a maximum yield within 50−60 min, which is consistent with the aforementioned and with prior reports.…”
Section: ■ Introductionmentioning
confidence: 99%
“…10 The screening effect has been demonstrated experimentally by examples of the G-FETs with high k HfO 2 and ferroelectric PZT as the top and back gate, respectively. 13,19 The G-FET on PZT reveals carrier mobility up to 70 000 cm 2 /V s in a fewlayer graphene at room temperature. 19 In both cases, the charged impurities are assumed to be located inside or at the interface of the high dielectric constant material, such as oxygen vacancies in HfO 2 , or adsorbates on the PZT surface.…”
mentioning
confidence: 99%
“…For instance, the charged impurities can be associated with water molecules trapped at the graphene-substrate interface or with the oxygen vacancies in the gate dielectric. [11][12][13] Noncontrollable concentration and spatial inhomogeneity of the charged impurities result in that the mobility in the G-FETs is typically well below the highest reported values (Refs. 9 and 14-18), the residual carrier concentration is high, it is non-reproducible, and spatially distributed over the wafer surface.…”
mentioning
confidence: 99%