2001
DOI: 10.1109/6040.938295
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Enhanced transmission characteristics of on-chip interconnects with orthogonal gridded shield

Abstract: On-chip interconnects over an orthogonal grid of grounded shielding lines on the silicon substrate are characterized by full-wave electromagnetic simulation. The analysis is based on a unit cell of the periodic shielded interconnect structure. It is demonstrated that the shielding structure may help to significantly enhance the transmission characteristics of on-chip interconnects particularly in analog and mixed-signal integrated circuits with bulk substrate resistivity on the order of 10 -cm.Simulation resul… Show more

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Cited by 28 publications
(8 citation statements)
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“…However, the dispersion improvement does not depend on this 0-7803-8128-9/03/$17.00 0 2003 IEEEratio. The microstrip structure, which has CO?=', shows frequency dependence, instead of dispersionless as predicted in[4]. Microstrip dispersions have been discussed intensively in[9,10], and are probably caused by mode conversions.…”
mentioning
confidence: 76%
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“…However, the dispersion improvement does not depend on this 0-7803-8128-9/03/$17.00 0 2003 IEEEratio. The microstrip structure, which has CO?=', shows frequency dependence, instead of dispersionless as predicted in[4]. Microstrip dispersions have been discussed intensively in[9,10], and are probably caused by mode conversions.…”
mentioning
confidence: 76%
“…Aluminum is used for both metal 1 (MI) and metal 2 (M2) layers. MI line widths were kept at -2 pm, which is narrower than the grid lines discussed in [4] but more likely to be encountered in on-chip interconnect designs. Comparison structures with an MI ground plate (line #I) and without an MI layer (line #6) are also fabricated.…”
Section: Test Structures Figures I(a)-(b)mentioning
confidence: 99%
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“…This minimal-loss phenomenon is similar to the ones in [44], [63], where the minimum attenuation is related to the critical substrate conductivity instead. [88], cross dots: empirical formula [56]).…”
Section: Metal-insulator-metal-semiconductor Structuresmentioning
confidence: 99%
“…Frequency behavior of (a) series resistance and (b) inductance per unit line for the MIMS structure inFig. 6.7 (circle dots: results from[88]). …”
mentioning
confidence: 99%