2012
DOI: 10.1107/s0909049512004463
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Energy resolution of the CdTe-XPAD detector: calibration and potential for Laue diffraction measurements on protein crystals

Abstract: The XPAD3S-CdTe, a CdTe photon-counting pixel array detector, has been used to measure the energy and the intensity of the white-beam diffraction from a lysozyme crystal. A method was developed to calibrate the detector in terms of energy, allowing incident photon energy measurement to high resolution (approximately 140 eV), opening up new possibilities in energy-resolved X-ray diffraction. In order to demonstrate this, Laue diffraction experiments were performed on the bending-magnet beamline METROLOGIE at Sy… Show more

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Cited by 17 publications
(18 citation statements)
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“…The tomography rotation axis can be used to select the orientation of the scattering vector, or can be oscillated to sample a larger selection of grains, depending on the sample and the requirements of the measurement. Furthermore the white beam allows Laue diffraction approaches to be used (Medjoubi et al, 2012).…”
Section: Combining Diffraction With Tomographic Imagingmentioning
confidence: 99%
“…The tomography rotation axis can be used to select the orientation of the scattering vector, or can be oscillated to sample a larger selection of grains, depending on the sample and the requirements of the measurement. Furthermore the white beam allows Laue diffraction approaches to be used (Medjoubi et al, 2012).…”
Section: Combining Diffraction With Tomographic Imagingmentioning
confidence: 99%
“…Consequently, 1-k is the probability for an X-ray to deposit fully its Gaussian-distributed energy in one pixel. Therefore, under these approximations, the expression of the energy deposition spectrum simplifies into the model proposed by Ponchut [11,20].…”
Section: Energy Deposition Spectrummentioning
confidence: 99%
“…The development of large area X-ray detectors with high sensitivity, large dynamic range, low noise and fast response makes possible this kind of measurement at synchrotron facilities (Brö nnimann et al, 2003;Ponchut et al, 2005Ponchut et al, , 2007Ejdrup et al, 2009;Henrich et al, 2009;Basolo et al, 2007;Rossi et al, 1999;Delpierre et al, 2007). The X-ray pixel area detector (XPAD) (Delpierre et al, 2007;Medjoubi et al, 2010Medjoubi et al, , 2012Fertey et al, 2013, and references therein) used for this study has a 500 mm-thick Si sensor and is composed of eight modules (each of them of size 15.6 Â 72.8 mm, pixelated silicon sensor); it is shown schematically in Fig. 2.…”
Section: Characteristics Of the X-ray Pixel Area Detectormentioning
confidence: 99%