2004
DOI: 10.1016/j.nima.2003.11.327
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Energy dispersive X-ray spectroscopy with microcalorimeters

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Cited by 22 publications
(6 citation statements)
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“…Figure 3b and 3c indicates the presence of the Ta and Si elements detected by measuring the characteristic peaks of the -Ta L  (8.145 KeV) and -Si K series lines, respectively. Note that since -Ta M  (1.709 KeV) and -Si K  (1.739 KeV) were separated by only 30 eV, the detector could not resolve these lines [31,32] . The detection results of both the Si and Ta elements overlapped, as seen in Figure 3c.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 3b and 3c indicates the presence of the Ta and Si elements detected by measuring the characteristic peaks of the -Ta L  (8.145 KeV) and -Si K series lines, respectively. Note that since -Ta M  (1.709 KeV) and -Si K  (1.739 KeV) were separated by only 30 eV, the detector could not resolve these lines [31,32] . The detection results of both the Si and Ta elements overlapped, as seen in Figure 3c.…”
Section: Resultsmentioning
confidence: 99%
“…Cryogenic x-ray detector arrays, such as the microcalorimeter [181][182][183] , transition-edgesensor (TES) microcalorimeter [184][185][186] , and superconducting tunnel junction (STJ) detector 187 , are…”
Section: Challenges For Burning Plasmasmentioning
confidence: 99%
“…• Des détecteurs cryogéniques sont actuellement commercialisés pour l'analyse de matériaux par fluorescence X (Hollerith et al, 2004). Les résolutions en énergie sont de l'ordre de 20 eV à 6 keV et 10 eV à 1,5 keV apportant une sensibilité remarquable, appréciée entre autres, par les constructeurs de semi-conducteurs pour l'analyse d'impuretés.…”
Section: Applications Dans L'industrieunclassified