2006
DOI: 10.1103/physrevlett.96.176102
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Energetic Surface Smoothing of Complex Metal-Oxide Thin Films

Abstract: A novel energetic smoothing mechanism in the growth of complex metal-oxide thin films is reported from in situ kinetic studies of pulsed laser deposition of on , using x-ray reflectivity. Below 50% monolayer coverage, prompt insertion of energetic impinging species into small-diameter islands causes them to break up to form daughter islands. This smoothing mechanism therefore inhibits the formation of large-diameter 2D islands and the seeding of 3D growth. Above 50% coverage, islands begin to coalesce and thei… Show more

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Cited by 61 publications
(49 citation statements)
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References 21 publications
(33 reference statements)
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“…4(b), the intensity between pulses remains nearly constant within the noise level of RHEED signal. In PLD, intensity modulations of specularly reflected RHEED 22 and XRD 23,24 spots similar to our results, have been reported. Some of those measurements exhibit intensity recovery between pulses; this has been attributed to 4/1/07 p.10 interlayer transport 23,24 or reduction of adatom density 22 .…”
Section: /1/07 P7supporting
confidence: 79%
See 2 more Smart Citations
“…4(b), the intensity between pulses remains nearly constant within the noise level of RHEED signal. In PLD, intensity modulations of specularly reflected RHEED 22 and XRD 23,24 spots similar to our results, have been reported. Some of those measurements exhibit intensity recovery between pulses; this has been attributed to 4/1/07 p.10 interlayer transport 23,24 or reduction of adatom density 22 .…”
Section: /1/07 P7supporting
confidence: 79%
“…In PLD, intensity modulations of specularly reflected RHEED 22 and XRD 23,24 spots similar to our results, have been reported. Some of those measurements exhibit intensity recovery between pulses; this has been attributed to 4/1/07 p.10 interlayer transport 23,24 or reduction of adatom density 22 . Our observation of an insignificant intensity change during the growth interruptions between pulses following each abrupt change during a burst of deposition suggests that the surface is effectively frozen during the inter-pulse periods.…”
Section: /1/07 P7supporting
confidence: 79%
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“…All of these potentially influence the kinetics of the film formation on the growing surface and so affect the competition between deposition and diffusion that has a strong effect on nucleation and growth [28]. Additional energy in the deposited species may activate diffusion and film crystallisation processes, however a higher rate reduces the time available for these processes to take place.…”
Section: θ-2θ X-ray Diffractionmentioning
confidence: 99%
“…The dynamics of the growth during PLD have been extensively studied using reflection high energy electron diffraction (RHEED) [3,4]. However, with RHEED it is not possible to obtain detailed information about the atomic structure during growth, which motivated the use of x rays [5][6][7][8][9][10][11]. Here we report on x-ray diffraction measurements during the PLD growth of YBCO on SrTiO 3 001 (STO).…”
mentioning
confidence: 99%