2013
DOI: 10.1016/j.tsf.2013.02.034
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Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol–gel method

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Cited by 17 publications
(9 citation statements)
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“…The obtained results show that the refractive index is slightly greater than the refractive index of bulk ZnO (2.0) and then become nearly constant with increasing wavelength (Kaid and Ashour 2007). The similar increment in the refractive index is observed for Erdoped ZnO thin films (Miao et al 2013). The refractive index of Al-doped film shows a variation up to 2.64 in the visible region which is preferred for antireflection coating materials.…”
Section: Optical Propertiessupporting
confidence: 64%
“…The obtained results show that the refractive index is slightly greater than the refractive index of bulk ZnO (2.0) and then become nearly constant with increasing wavelength (Kaid and Ashour 2007). The similar increment in the refractive index is observed for Erdoped ZnO thin films (Miao et al 2013). The refractive index of Al-doped film shows a variation up to 2.64 in the visible region which is preferred for antireflection coating materials.…”
Section: Optical Propertiessupporting
confidence: 64%
“…It is due to this reason that the film exhibited better crystalline nature at 6% of Ti. A similar observation of increased refractive index has been reported in Er doped ZnO thin films [31]. In the present work, the Ti doped ZnO films shows the varied refractive index from 2 to 2.8, that lie very well within the visible region, and therefore it can work well as the material for antireflection coating.…”
Section: Optical Propertiessupporting
confidence: 90%
“…Therefore, it has become essential to control the optical constants of ZnO. Spectroscopic ellipsometry technique is a relevant tool for such optical analysis [8][9][10][11][12][13][14][15][16][17][18][19]. In the previous works in literature, dispersion laws such as Cauchy [8,9], Forouhi-Bloomer [8,9], Tauc-Lorentz [9][10][11][12], Tanguy [13,14] or wavelength-by-wavelength method [20,21] were used to extract the optical constants of ZnO by modeling spectroscopic ellipsometry (SE) data.…”
Section: Introductionmentioning
confidence: 99%