2020
DOI: 10.1109/tthz.2020.3006744
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Electronic Calibration for Submillimeter-Wave On-Wafer Scattering Parameter Measurements Using Schottky Diodes

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Cited by 2 publications
(1 citation statement)
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“…If the sensor element is located offchip, it is possible to create a reference plane outside the analyzer by means of a set of on-wafer [34] or waveguide [35] calibration standards. More advanced methods employ electronically tunable on-wafer standards [36] or calibration by different reference MUTs [37] at the sensor.…”
Section: A Fundamentalsmentioning
confidence: 99%
“…If the sensor element is located offchip, it is possible to create a reference plane outside the analyzer by means of a set of on-wafer [34] or waveguide [35] calibration standards. More advanced methods employ electronically tunable on-wafer standards [36] or calibration by different reference MUTs [37] at the sensor.…”
Section: A Fundamentalsmentioning
confidence: 99%