2007
DOI: 10.1016/j.jeurceramsoc.2007.02.037
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Electron trapping of laser-induced carriers in Er-doped SnO2 thin films

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Cited by 29 publications
(44 citation statements)
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“…This result is very interesting for the design of electroluminescent devices, where the electrical conductivity of the SnO 2 sample is the most relevant parameter. This effect is the opposite of the expected variation in conductivity caused by the grain shrinkage due to the presence of doping 17 . Besides, the increase of electrical conductivity for low pH must be taken into account on the design of optoelectronic devices, because the highest infrared emission (about 1540 nm) takes place for pH about 7 35 .…”
Section: Low Temperature Electrical Characterization Of Thin Filmsmentioning
confidence: 72%
See 1 more Smart Citation
“…This result is very interesting for the design of electroluminescent devices, where the electrical conductivity of the SnO 2 sample is the most relevant parameter. This effect is the opposite of the expected variation in conductivity caused by the grain shrinkage due to the presence of doping 17 . Besides, the increase of electrical conductivity for low pH must be taken into account on the design of optoelectronic devices, because the highest infrared emission (about 1540 nm) takes place for pH about 7 35 .…”
Section: Low Temperature Electrical Characterization Of Thin Filmsmentioning
confidence: 72%
“…Er 3+ is incorporated into SnO 2 lattice substitutional in Sn 4+ sites and exhibits an acceptor-like behavior in tin dioxide, leading to a high degree of electrical charge compensation and high resistivity films. Ion incorporation at grain boundary, caused by low solubility limit of rare-earth ions in SnO 2 (less than 0.1 mol%), may also contribute for low conductivity 17 . In this communication we present electrical characteristics of undoped SnO 2 thin films obtained from colloidal suspensions with distinct pH and the influence of slightly doping with trivalent rare earth ion Er .…”
Section: Introductionmentioning
confidence: 99%
“…At 250K, this ratio deviates from the observed tendency and the ratio value is not as low as expected, suggesting that the Sn electrode deposited on the SnO 2 film may be playing a different role in this temperature 20 . It is interesting to mention that 200-250 K is in the temperature range where the capture by defects is mostly active, including trapping by oxygen vacancies 21,22 , which is very relevant because these samples are not doped. Then, the depletion layer close to the interface metal-semiconductor may be influenced by the electron trapping by oxygen vacancies, which does not affect the device performance when the temperature is additionally decreased, because the interfacial layer is completely depleted and the overall resistivity is higher.…”
Section: Resultsmentioning
confidence: 99%
“…It is interesting to notice that the least photo-induced excitation takes place about 200 K, in agreement with the evaluation of relative resistance of source-drain to source-gate (Figure 2), because at 250K, this ratio deviates from the observed tendency and is not as low as expected. Besides the possible Sn electrode influence, it is interesting to recall that 200-250 K is the temperature range where the capture by defects is mostly active, including trapping by oxygen vacancies 21,22 . In the case of 4at%Sb-doped SnO 2 , reported in Figure 4, the least excitation is about 200 K, suggesting a poor optical ionization of defects, in this case Sb-centers must be added to oxygen vacancies.…”
Section: Resultsmentioning
confidence: 99%
“…Our model for the decay of conductivity for above bandgap excitation in SnO 2 :Er has lead to three distinct levels [11]: oxygen vacancy, which is dominating for undoped SnO 2 thin films, Er 3+ located at grain boundary, domination for SnO 2 thin films with Er concentration above the saturation limit (about 0.1%atEr [12]) and substitutional to Sn 4+ sites, which is the governing trapping level below the saturation limit…”
Section: Results -Discussionmentioning
confidence: 99%