Electron energy-loss spectra of graphene oxide for the determination of oxygen functionalities

D’Angelo, D.; Bongiorno, Corrado; Amato, Michele; Deretzis, Ioannis; Magna, Antonino La; Compagnini, Giuseppe; Spanò, S.F.; Scalese, S.

doi:10.1016/j.carbon.2015.06.025

Cited by 38 publications

(42 citation statements)

References 26 publications

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“…fullerene-like) [78,[92][93][94][95][96][97]. For instance, aromatic C-OH group will give rises to transitions to π* states in the energy range 285.8-286.4 eV, C=O group to transitions to π* states in the energy range 286.5-288.3 eV, C-H group to transitions to σ* states in the energy range 287.6-288.2 eV and aromatic carbonyl and carboxyl groups to transitions to π* states in the energy range 287-288.5 eV [54,78,[92][93][94]96].…”

Section: In-depth Chemical Inhomogeneitiesmentioning

confidence: 99%

Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopy

Lajaunie

Pardanaud

Martin

et al. 2017

Carbon

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Hydrogenated amorphous carbon thin films (a:C-H) are very promising materials for numerous applications. The growing of relevance of a:C-H is mainly due to the long-term stability of their outstanding properties. For improving their performances, a full understanding of their local chemistry is highly required. Fifteen years ago, electron energy-loss spectroscopy (EELS), developed in a transmission electron microscope (TEM), was the technique of choice to extract such kind of quantitative information on these materials. Other optical techniques, as Raman spectroscopy, are now clearly favored by the scientific community. However, they still lack of 2 the spatial resolution offered by TEM-EELS. In addition, nowadays, the complexity of the physics phenomena behind EELS is better known. Here, a:C-H thin films have been isothermally annealed and the evolution of their physical and chemical parameters have been monitored at the local and macroscopic scales. In particular, chemical in-depth inhomogeneities and their origins are highlighted. Furthermore, a novel procedure to extract properly and reliably quantitative chemical information from EEL spectra is presented. Finally, the pertinence of empirical models used by the Raman community is discussed. These works demonstrate the pertinence of the combination of local and macroscopic analyses for a proper study of such complex materials.

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Section: In-depth Chemical Inhomogeneitiesmentioning

confidence: 99%

Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopy

Lajaunie

Pardanaud

Martin

et al. 2017

Carbon

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“…The C K‐edge region of pristine graphite (not shown) shows two main peaks at 285.2 and 292.0 eV due to the 1s‐π* and 1s‐σ* electronic transition, respectively . In contrast, the C K‐edge in EEL spectra of graphene oxide exhibit multipeak spectral features that are assigned to a prevalence of different oxygen groups . The peak at 287 eV was identified as the indication of the presence of epoxides on the graphene oxide surface and the peak at 285.5 eV is related mainly to hydroxyl groups.…”

Section: Resultsmentioning

confidence: 99%

EPR Study of Porous Si:C and SiO₂:C Layers

Савченко

Vasin

Muto

et al. 2018

Physica Status Solidi (b)

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Initial porous silicon (por-Si), carbonized porous silicon (por-Si:C), and carbon-incorporated porous silicon oxide (por-SiO 2 :C) layers are studied by electron paramagnetic resonance (EPR) at T ¼ 10-13 K. Scanning transmission electron microscopy and electron energy loss (EEL) spectroscopy show that por-Si:C and por-SiO 2 :C layers have a highly disordered structure with mixing sp 2 and sp 3 C─C bonds. In the por-SiO 2 :C layers, the peak of the oxygen bonded to carbon in the form of hydroxyl groups is found in the EEL spectrum of the C K-edge region. Low-intensity signals of Lorentzian lineshape are detected in the EPR spectrum of por-Si, por-Si:C, por-SiO 2 :C layers. One of them is attributed to the P b0 defect at the Si/SiO 2 interface of nanocrystalline grain and the second to the silicon dangling bonds (SiDB) localized in nanocrystalline Si. The carbonization of por-Si layers and subsequent oxidation of por-Si:C gives rise to the appearance of additional EPR signals of high intensity at g ¼ 2.0035(3) in por-Si:C and at g ¼ 2.0030(3) in por-SiO 2 :C, which are assigned to carbon-related defects (CRD) and carbon clusters, correspondingly. It was found that predominant defect types in por-Si:C and por-SiO 2 :C layers are CRD and carbon clusters, respectively, while the spin concentration of P b0 interface defects and SiDB is low.

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“…http://engine.scichina.com/doi/10.1016/j.jechem.2019.03.003 Fig. S1(d) contains the EELS signals recorded for the GrPt before (BT) and after (PT) electrochemical treatment; thus, in the carbon K-edge region, the peaks are identified for both situations at 284.7 and 293.3 eV and can be attributed to 1 s -π * and 1 s -σ * electronic transitions, respectively [29,33,34] . These features in the K-edge region are characteristic of graphene layers ( sp 2 bonded (C = C) carbon).…”

Section: Eels and Xps Measurements Of Grpt Before And After Mormentioning

confidence: 99%

Platinum nanoparticles coated by graphene layers: A low-metal loading catalyst for methanol oxidation in alkaline media

Berghian‐Grosan

Radu

Biriş

et al. 2020

Journal of Energy Chemistry

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Electron energy-loss spectra of graphene oxide for the determination of oxygen functionalities

Cited by 38 publications

References 26 publications

Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopy

Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopy

EPR Study of Porous Si:C and SiO₂:C Layers

Platinum nanoparticles coated by graphene layers: A low-metal loading catalyst for methanol oxidation in alkaline media

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Electron energy-loss spectra of graphene oxide for the determination of oxygen functionalities

Cited by 38 publications

References 26 publications

Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopy

Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopy

EPR Study of Porous Si:C and SiO2:C Layers

Platinum nanoparticles coated by graphene layers: A low-metal loading catalyst for methanol oxidation in alkaline media

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Product

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EPR Study of Porous Si:C and SiO₂:C Layers