Electromagnetic emanation exploration in FPGA-based digital design

Nguyen, Van Toan; Tung, Dam Minh; Lee, Jeong-Gun

doi:10.1007/s11771-019-3990-1

Cited by 4 publications

(2 citation statements)

References 11 publications

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“…[2][3][4]. Although the traditional testing method can provide effective experimental data, the experimental data is not accurate enough due to the long measurement distance and various losses, such as free space field propagation loss, shielding room window loss, shielding room cavity loss, etc [5]. This study aims to provide a novel method for the performance testing of shielding materials.…”

Section: Introductionmentioning

confidence: 99%

A Study on the High-Resolution Full Frequency Shielding Effectiveness Testing Method

Wu¹,

Zheng

et al. 2022

Preprint

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The shielding effectiveness is a key index to measure the performance of electromagnetic protective materials However, the traditional shielding effectiveness testing methods exist many losses, there by the experimental data varying under different test conditions. This paper aims to provide a novel NV-center based optical high-resolution shielding performance testing method, a method that may directly provide the distribution of the electromagnetic field on the surface of the electromagnetic shielding material. This method was used to test the shielding performance of two different electromagnetic shielding materials, and comparison with the surface scan method has proved the feasibility and reliability of the optical high-resolution test method, providing a new idea for testing the effectiveness of electromagnetic shielding materials more accurately and effectively.

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Section: Introductionmentioning

confidence: 99%

A Study on the High-Resolution Full Frequency Shielding Effectiveness Testing Method

Wu¹,

Zheng

et al. 2022

Preprint

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“…[1] presented an alternative approach to measure electromagnetic emissions by locating the entire FPGA test board inside the GTEM cell instead of mounting it at the wall of the cell. In [2], authors evaluate and analyze the impact of I/O switching activities on the EME of a Xilinx Spartan-3 FPGA. In [3], Mohamed Ramdani at al.…”

Section: Introductionmentioning

confidence: 99%

Preliminary Study on the Impact of Place and Route Strategy on FPGA Electromagnetic Emission

Lara

Constante

Benfica

et al. 2021

2021 Argentine Conference on Electronics (CAE)

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Dense integration and high operating frequencies associated with increased number of I/O buffers of FPGAs are factors contributing to electromagnetic emission (EME) increase. Consequently the radiation issue that used to be discussed at PCB level has shifted to component level. Thus it is of high interest and challenging to investigate chip electromagnetic performance. This paper presents a preliminary analysis about the impact of the placement and routing (P&R) process of logic inside the FPGA on the chip EME level. With this purpose, a softcore processor was placed and routed based on three different strategies in the configurable logic block (CLB) array of a commercial FPGA and executed an application code running over an operating system (OS). Three experiments based on farand near-field emission measurements have been performed. The obtained results indicate that the EME level can be affected up to 21.8% by the way the processor is placed and routed inside the FPGA.

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