Electroless deposition of Au, Pt, or Ru metallic layers on CdZnTe

A multi-technique characterization of electroless gold contacts on single crystal CdZnTe radiation detectors

“…Electroless gold contacts on Cd(Zn)Te have been extensively investigated before, with characterization methods such as Rutherford backscattering spectroscopy (RBS) [12][13][14], x-ray photoelectron spectroscopy (XPS) [15] and Auger electron spectroscopy (AES) [16] used to probe the MS interface formed during the deposition process. The current work aims to build on these previous studies by introducing a range of complementary materials characterization techniques, which when applied together, provide electrical, structural and detailed chemical information over a range of length scales.…”

Characterization of the metal–semiconductor interface of gold contacts on CdZnTe formed by electroless deposition

“…A tetrachloroauric(III) acid solution with a HAuCl 4 to H 2 0/HCl ratio of 1 : 25 was used for the electroless deposition [22,23,33]. The electroless reaction is dominated by the removal of cadmium rather than tellurium from the CdZnTe surface.…”

“…This is due to the greater standard potential, ΔE 0 , of the reaction with cadmium. The two competing reactions are stated in equations (1) and (2) [22]. A temperature controlled hot plate or ice bath was used to maintain the solution at the desired temperature, from 0 to 40 °C.…”

“…Electroless deposition has been observed to result in greater adhesion compared with thermally evaporated contacts [20]. This is explained by the increased chemical bonding and greater incorporation of gold into the metal-semiconductor interface [21,22]. Electroless deposition of gold has also been shown to produce better spectroscopy compared with sputtered or thermally evaporated contacts [21,[23][24][25].…”

“…Characterization techniques such as x-ray photoelectron spectroscopy (XPS) [25], Auger electron spectroscopy (AES) [23], Rutherford backscattering spectroscopy (RBS) [22,32,33], atomic force microscopy (AFM) [22,24,26,34,35] and scanning electron microscopy (SEM) [22,26] have been used in these investigations.…”