Electrochemical Growth and Characterization of Lead Sulphide Thin Films

Thanikaikarasan, S.; Mahalingam, T.; Veeramuthumari, S.; Ixtlilco, Luis

doi:10.14447/jnmes.v16i2.33

Cited by 3 publications

(2 citation statements)

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“…It is also observed from figures 3a and 3b that maximum value of crystallite size, minimum value of strain and dislocation density are noted for films with maximum thickness value around 950 nm which has been obtained at a deposition time and bath temperature around 30 minutes and 80ºC respectively. Similar functional dependency of microstructural parameters with deposition time for CuSe and PbS have been reported earlier [20,21].…”

supporting

confidence: 84%

Studies on Electrodeposited NiS Thin Films

Bharathi¹,

Thanikaikarasan²,

Chandrasekar

et al. 2014

J. New Mat. Electrochem. Sys.

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Thin films of NiS have been deposited on indium doped tin oxide coated conducting glass substrates using electrodeposition technique. Structural studies revealed that the deposited films exhibit hexagonal structure with preferential orientation along (002) plane. Structural parameters such as crystallite size, strain and dislocation density are calculated for films with different thickness values obtained at various deposition time. The film composition and surface morphology have been analyzed using scanning electron microscopy and energy dispersive analysis by X-rays. Optical absorption analysis showed that the deposited films possess band gap value around 0.7 eV.

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supporting

confidence: 84%

Studies on Electrodeposited NiS Thin Films

Bharathi¹,

Thanikaikarasan²,

Chandrasekar

et al. 2014

J. New Mat. Electrochem. Sys.

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“…2 and with Refs. [17][18][19]. The transition from a sulfur-rich phase to a copper-rich phase is due to high volatilization of sulfur.…”

Section: Structural Characterizationmentioning

confidence: 99%

Structural and thermoelectric properties of copper sulphide powders

Narjis

Outzourhit

Aberkouks³

et al. 2018

J. Semicond.

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Over the past few years, Cu-based materials have been intensively studied focusing on their structural and thermoelectric properties. In this work, copper sulphide powders were synthesized by the sol-gel method. The chemical composition and the morphological properties of the obtained samples were analyzed by X-ray diffraction, differential thermal analysis, and scanning electron microscopy. It is shown that the decomposition from one phase to another can be obtained by annealing. The electrical resistivity and the crystallite size were found to be strongly affected by the phase transition. Thermoelectric analyses showed that the digenite phase exhibits the highest power factor at room temperature. The Seebeck coefficient of the compound Cu1.8S shows a pronounced peak at the γ–β transition temperature. This behavior was statistically explained in terms of a dramatic increase in the disorder in the atoms-carriers ensemble.

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Investigation on Optical Properties of Silar-Grown Highly Oriented Lead Sulphide (PbS) Thin Films

Gamit,

Bhavsar,

Patel

2024

ITM Web Conf.

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Using lead nitrate, thiourea, as well as sodium hydroxide as chemical precursors, the lead sulphide powder was formed at room temperatures and (PbS), at a given room temperature thin film were deposited on a glass substrate using the (SILAR) method at varying numbers of cycles. The optical studies for powder form and thin films were performed by UV-VI diffuse reflectance spectrophotometer-3600 SHIMADZU and UV-VIS-NIR Spectrophotometry. It was discovered that the PbS powder form as well as thin films produced under ideal deposition circumstances were polycrystalline with a face-centered cubic structure. Optical studies for powder form and thin films were carried out using a UV-VI spectrometer and it revealed the existence of direct bandgap for powder form is 1.69 eV and for thin films values in the ranges of (1.45-2.32) eV.

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Electrochemical Growth and Characterization of Lead Sulphide Thin Films

Cited by 3 publications

References 0 publications

Studies on Electrodeposited NiS Thin Films

Studies on Electrodeposited NiS Thin Films

Structural and thermoelectric properties of copper sulphide powders

Investigation on Optical Properties of Silar-Grown Highly Oriented Lead Sulphide (PbS) Thin Films

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