1985
DOI: 10.1063/1.334768
|View full text |Cite
|
Sign up to set email alerts
|

Electrical properties of silicon nitride films plasma-deposited from SiF4, N2, and H2 source gases

Abstract: The electrical properties of the fluorinated silicon nitride films deposited from reactive plasma of SiF4-N2-H2 or SiF2-N2-H2 gas mixtures were investigated by changing the source SiF4 flow rate. A resistivity and breakdown strength as high as 1014–1016 Ω cm and 5–10 MV/cm, respectively, were reproducibly observed over a wide range of the N/Si ratio. The deep-trap densities and energy levels are not very dependent on the film composition. Their slight variation in the present deposition conditions can be under… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
12
0
1

Year Published

1988
1988
2012
2012

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 50 publications
(13 citation statements)
references
References 15 publications
0
12
0
1
Order By: Relevance
“…For example, SiN x :F film deposition from SiF 4 /N 2 plasma contain no hydrogen and the resulting film contains very high fluorine content while deposition rate of this gas mixture is rather low [1,2]. Deposition rate can be improved by adding SiH 4 or H 2 to the reactant.…”
Section: Introductionmentioning
confidence: 97%
See 2 more Smart Citations
“…For example, SiN x :F film deposition from SiF 4 /N 2 plasma contain no hydrogen and the resulting film contains very high fluorine content while deposition rate of this gas mixture is rather low [1,2]. Deposition rate can be improved by adding SiH 4 or H 2 to the reactant.…”
Section: Introductionmentioning
confidence: 97%
“…Low hydrogen content SiN x :H films have been deposited from fluorinated ammonia (NF 3 ) or silicon halides (SiF 4 , SiF 2 ) mixtures [1][2][3][4][5]. For example, SiN x :F film deposition from SiF 4 /N 2 plasma contain no hydrogen and the resulting film contains very high fluorine content while deposition rate of this gas mixture is rather low [1,2].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The main contribution to is provided by two bonding pads and the substrate separated by 0.3 m of silicon nitride. Taking 5 for silicon nitride [7], we obtain pF for two m bonding pads. This reduces the device modulation bandwidth to 1.2 GHz, which is close to the frequency at which the wavelength tuning collapses.…”
Section: High-speed Stark Wavelength Tuning Of Midirmentioning
confidence: 99%
“…Fluorinated silicon nitride films have been deposited from fluorinated ammonia (NF 3 ) or silicon halides (SiF 4 , SiF 2 ) mixtures in order to avoid the incorporation of hydrogen (Fainer et al, 1997), those films were demonstrated to have some advantages, such as the complete elimination of Si-H bonds from the films and an improvement in their chemical and electrical stability (Jun et al, 1999;Fujita et al, 1985).…”
Section: Introductionmentioning
confidence: 99%