1997
DOI: 10.1007/s11664-997-0007-x
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Electrical and optical properties of oxygen doped GaN grown by MOCVD using N2O

Abstract: Oxygen doped GaN has been grown by metalorganic chemical vapor deposition using N2O as oxygen dopant source. The layers were deposited on 2" sapphire substrates from trimethylgallium and especially dried ammonia using nitrogen (N2) as carrier gas. Prior to the growth of the films, an AlN nucleation layer with a thickness of about 300 AA was grown using trimethylaluminum. The films were deposited at 1085 degrees C at a growth rate of 1.0 mu m/h and showed a specular, mirrorlike surface. Not intentionally doped … Show more

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Cited by 39 publications
(36 citation statements)
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“…Since the activation energy of Mg dopants in GaN is large (~170 meV [24]), the nature of the transparency of p-type GaN is different than this one which takes place in n-type GaN where the activation energy of O donors is comparable with the thermal energy at room temperature (the activation energy of oxygen in GaN is ~29-32 meV [25][26][27]). Even if non-intentional deep donors are present in n-type GaN, the free carrier absorption determines the transparency of n-type GaN in the infrared spectral region.…”
Section: Resultsmentioning
confidence: 99%
“…Since the activation energy of Mg dopants in GaN is large (~170 meV [24]), the nature of the transparency of p-type GaN is different than this one which takes place in n-type GaN where the activation energy of O donors is comparable with the thermal energy at room temperature (the activation energy of oxygen in GaN is ~29-32 meV [25][26][27]). Even if non-intentional deep donors are present in n-type GaN, the free carrier absorption determines the transparency of n-type GaN in the infrared spectral region.…”
Section: Resultsmentioning
confidence: 99%
“…1, lead to narrow XRD linewidths. On the other hand, the use of high purity gases is essential for the growth of GaN, because oxygen, which is assumed to be the most frequent impurity in ammonia, is incorporated very efficiently in GaN [4][5][6]. Acting as a shallow donor [7,8] it causes an undesired electron background concentration.…”
Section: Methodsmentioning
confidence: 99%
“…With the exception of the substrate interface region [3], very low background carrier concentrations can now be achieved, by implementing appropriate purifying techniques. Experiments with intentional oxygen doping have also been performed, to study the donor properties, and to explore oxygen as a possible alternative to Si for n-type doping [4][5][6][7].…”
mentioning
confidence: 99%