“…Trimethylgallium (TMGa), triethylgallium (TEGa), trimethylindium (TMIn), trimethylaluminum (TMAl) and ammonia ðNH 3 Þ were used as precursors. The substrate was first heated to 1120 1C in a hydrogen ambient and then the temperature was reduced to grow the oxygen-doped AlN nucleation layer [8]. At 1120 1C, a high-quality 1 mm thick GaN layer was deposited on the buffer (90 00 in XRD-Rocking curve).…”