2001
DOI: 10.1002/1521-396x(200112)188:2<629::aid-pssa629>3.0.co;2-#
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An Oxygen Doped Nucleation Layer for the Growth of High Optical Quality GaN on Sapphire

Abstract: We present a new oxygen-doped AlN nucleation layer for the growth of high quality GaN on sapphire by metalorganic vapor phase epitaxy. We investigated in detail the influence of oxygen in the gas phase in a range from 0.5 to 10 ppm. Around 4 ppm we obtained very stable and reproducible process conditions. A further optimization of the nucleation thickness resulted in GaN layers showing smooth and featureless surfaces with excellent spectroscopic properties. The best values were 45 arcsec in XRD rocking curve o… Show more

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Cited by 26 publications
(13 citation statements)
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“…The layers were deposited on 2 in c-plane (0 0 0 1) epi-ready sapphire wafers using an oxygen doped AlN nucleation layer (NL) [16]. Further details about the NL deposition and the subsequent GaN growth are given elsewhere [17].…”
Section: Methodssupporting
confidence: 91%
“…The layers were deposited on 2 in c-plane (0 0 0 1) epi-ready sapphire wafers using an oxygen doped AlN nucleation layer (NL) [16]. Further details about the NL deposition and the subsequent GaN growth are given elsewhere [17].…”
Section: Methodssupporting
confidence: 91%
“…Trimethylgallium (TMGa), triethylgallium (TEGa), trimethylindium (TMIn), trimethylaluminum (TMAl) and ammonia ðNH 3 Þ were used as precursors. The substrate was first heated to 1120 1C in a hydrogen ambient and then the temperature was reduced to grow the oxygen-doped AlN nucleation layer [8]. At 1120 1C, a high-quality 1 mm thick GaN layer was deposited on the buffer (90 00 in XRD-Rocking curve).…”
Section: Methodsmentioning
confidence: 99%
“…In this study we investigate the optimization of the growth conditions for an oxygen-doped AlN NL [22] enabling the stable growth of high-quality GaN in metalorganic vapor phase epitaxy (MOVPE). We studied the influence of oxygen during the nucleation as well as the impact of the reactor pressure and the V-III ratio on the parasitic reactions between group-III source and ammonia [23,24].…”
Section: Introductionmentioning
confidence: 99%