2022
DOI: 10.3390/nano12030570
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Electrical and Optical Characterization of CsPbCl3 Films around the High-Temperature Phase Transitions

Abstract: Large-area CsPbCl3 films in the range 0.1–1.5 μm have been grown by radio frequency (RF)-magnetron sputtering on glass substrates by means of a one-step procedure. Three structural phase transitions have been detected, which are associated with hysteresis behavior in the electrical current when measured as a function of temperature in the range 295–330 K. Similarly, photoluminescence (PL) experiments in the same temperature range bring evidence of a non-monotonic shift of the PL peak. Detailed electrical chara… Show more

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Cited by 5 publications
(8 citation statements)
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“…The indication of treated sample means a thermal annealing at 150 °C for 20 h. The plots evidence no major differences depending on the film thickness and thermal treatment in the PL intensity and lineshape. Results are in agreement with those found with similar samples grown on glass substrates [13].…”
Section: Optical and Electrical Characterizationsupporting
confidence: 92%
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“…The indication of treated sample means a thermal annealing at 150 °C for 20 h. The plots evidence no major differences depending on the film thickness and thermal treatment in the PL intensity and lineshape. Results are in agreement with those found with similar samples grown on glass substrates [13].…”
Section: Optical and Electrical Characterizationsupporting
confidence: 92%
“…Taking into consideration geometry and thickness of the device, from these data we get a room temperature resistivity ρ = 1.2 × 10 7 Ω m, in good agreement with Ref. [13].…”
Section: Optical and Electrical Characterizationsupporting
confidence: 88%
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