2006
DOI: 10.1016/j.apsusc.2006.06.017
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Effects of UV photon irradiation on SiOx (0<x<2) structural properties

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Cited by 17 publications
(3 citation statements)
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“…Using the method described in Ref. [24], the Si excess estimated from FTIR data was found to decrease from 12 to 6 at% (Fig. 1b, curve 1).…”
Section: The Effect Of Total Plasma Pressurementioning
confidence: 98%
“…Using the method described in Ref. [24], the Si excess estimated from FTIR data was found to decrease from 12 to 6 at% (Fig. 1b, curve 1).…”
Section: The Effect Of Total Plasma Pressurementioning
confidence: 98%
“…The Si excess induced by r H variation was estimated from the evolution of the FTIR spectra recorded at normal incidence (not shown) following the method described in Ref. [20]. Briefly summarized, this method is based on a linear relation between the shift on the TO 3 peak position for a sub-stoichiometric SiO x (1oxo2) matrix, with respect to that of SiO 2 , and the stoichiometric coefficient x.…”
Section: Effect Of Hydrogen Ratementioning
confidence: 99%
“…SiO 2 is coated on the inner surface of our samples as an anti-scratch layer to enhance the mechanical properties [3,12,13]. Extensive investigations regarding anti-scratch coating materials, methods and effects of UV photons on them have been undertaken [14]- [16]. However, studying the influence of coherent illumination, particularly visible to infrared, on the optical properties and the morphology of coated PCs has remained a subject of interest.…”
Section: Introductionmentioning
confidence: 99%