Effects of preparation conditions on the optical properties of thin films of tellurium oxide

Abstract

Thin films of tellurium oxide were prepared by thermal evaporation. The effects of preparation conditions and post-deposition vacuum annealing on the optical constants of the thin films were studied. Substantial changes in the optical constants, density, structure and stoichiometry were observed following changes in the preparation conditions and annealing. The majority of the films were found to be deficient in oxygen. The presence of metallic Te was detected in films deposited on heated substrates and in all the films that were annealed. All the samples showed some degree of absorption at photon energies below the band gap. One explanation for this absorption could be oxygen deficiency and the presence of metallic Te.

An Innovative Postdeposition Annealing Approach Producing Centimeter‐Scale In2O3/In2(TeO3)3 Bulk Heterojunction Thin Film for Room‐Temperature Persistent Photoconductivity

“…Figure 2d presents the thickness profile of the annealed film, revealing a thickness of ≈34 nm. Therefore, an oxidation state of Te is demonstrated, [46] further conforming the production of the In 2 (TeO 3 ) 3 phase shown by the above XRD results. Apparently, the annealed film (dark line) exhibits totally distinct diffraction feature from that of as-deposited one (blue line).…”

Fast Detection of Precipitates and Oxides on CdZnTe Surfaces by Spectroscopic Ellipsometry

“…20 Both the e(x) of CdO 21 and that of TeO 2 [22][23][24] have an indirect absorption edge within the measured range. The exact position of the Cd(OH) 2 gap is not well known; however, band structure considerations suggest that it is larger than that of CdO.…”

Optical properties of swift ion beam irradiated CdTe thin films

“…The results show that there is a decrease in the film thickness after irradiation. Therefore the observed increase of n for irradiated films could be due to the decrease in the film thickness because, a decrease in thickness of the film results in an increase in its density that, in turn, leads to a higher refractive index (Lorentz-Lorentz law) [12]. The estimated values of n at λ = 850 nm are given in the Table 1.…”