Proceedings. 2004 IEEE Computational Systems Bioinformatics Conference
DOI: 10.1109/nvmt.2004.1380800
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Effects of heavy ion exposure on nanocrystal nonvolatile memory

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Cited by 2 publications
(2 citation statements)
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“…This is unlike FG memories irradiated with the same ions, which, as illustrated in Fig. 23, display tails even after being reprogrammed, due to Radiation Induced Leakage Current (RILC) in the tunnel oxide [112].…”
Section: A Nanocrystal Memoriesmentioning
confidence: 96%
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“…This is unlike FG memories irradiated with the same ions, which, as illustrated in Fig. 23, display tails even after being reprogrammed, due to Radiation Induced Leakage Current (RILC) in the tunnel oxide [112].…”
Section: A Nanocrystal Memoriesmentioning
confidence: 96%
“…23, where the results of the irradiation of a nanocrystal memory with heavy ions are presented [112]. After the exposure to heavy ions, a tail appears.…”
Section: A Nanocrystal Memoriesmentioning
confidence: 99%