IEEE Radiation Effects Data Workshop, 2005.
DOI: 10.1109/redw.2005.1532661
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Recent single event effects results for candidate spacecraft electronics for NASA

M.V. O'Bryan1,
K.A. LaBel2,
S.D. Kniffin3
et al.
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Cited by 7 publications
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References 7 publications
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Single-Event Latchup Measurements on COTS Electronic Devices for Use in ISS Payloads

Irom
1
,
Allen
2
,
Vartanian
3
2017
2017 IEEE Radiation Effects Data Workshop (REDW)
6
0
3
0
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Single-Event Latchup Measurements on COTS Electronic Devices for Use in ISS Payloads

Irom
1
,
Allen
2
,
Vartanian
3
2017
2017 IEEE Radiation Effects Data Workshop (REDW)
6
0
3
0
View full textAdd to dashboardCite

Single-Event Latchup Measurements on Wireless and Powerline Network Communication Devices for Use in Mars Missions

Irom
1
,
Vartanian
2
,
Allen
3
2018
2018 IEEE Nuclear &Amp; Space Radiation Effects Conference (NSREC 2018)
4
0
0
0
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Heavy Ion Single Event Effects (SEE) results for OPA128 Electrometer Grade Operational Amplifier

Katz
1
,
Likar
2
,
Pham
3
et al. 2021
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
2
0
0
0
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