2010
DOI: 10.1063/1.3371678
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Effects of composition, strain, and atomic disorder on optical phonon frequencies in Si1−xGex

Abstract: Optical phonon shift coefficients are studied over the entire composition range of Si1−xGex, taking into account the effects of composition, atomistic disorder and strain. Ab initio calculations complement various experimental observations found in the literature by revealing that strain effects on the optical phonons—both hydrostatic and biaxial—vary nonlinearly with composition. Additionally, the pure mode frequencies of the highest optical phonon modes in unstrained Si1−xGex are found to shift linearly with… Show more

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Cited by 13 publications
(8 citation statements)
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“…It is known that the Raman frequency shift in semiconductor solid solutions is affected by the composition and strain, which are not always independent [28,29].…”
Section: Introductionmentioning
confidence: 99%
“…It is known that the Raman frequency shift in semiconductor solid solutions is affected by the composition and strain, which are not always independent [28,29].…”
Section: Introductionmentioning
confidence: 99%
“…4, where the two spectra are plotted, displaying an intense Ge peak and the small Ge-Ge and Si-Ge bands of the SiGe alloy. [27][28][29] Due to the low silicon content of the alloy, the Si-Si band of the SiGe is too low to be detected. The SiGe bands prove that the top layer is preserved in both cases.…”
Section: Resultsmentioning
confidence: 99%
“…Several authors 40,41 reported that for x Ge larger than 50%, the Si-Ge peak shifts to lower frequency values as the strain changes from compressive (negative) to tensile (positive). Thus the red shift of the Si-Ge peak, measured while moving from the edge to the center of the nano-stripe (see Fig.…”
Section: (C))mentioning
confidence: 99%