1982
DOI: 10.1063/1.330419
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Effects of annealing on the electrical properties of CdxHg1−xTe

Abstract: CdxHg1−xTe with 0.17<x<0.31 has been annealed using closed-tube and open-tube methods. In both methods the mercury vapor pressure during an anneal was controlled by a mercury reservoir held at a temperature either the same as the CdxHg1−xTe (isothermal anneal), or lower than the CdxHg1−xTe (two-temperature anneal). Isothermal anneals carried out in closed-tube and open-tube systems convert material which is initially p type by native defects to n type. Two-temperature, closed-tube anneals can be … Show more

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Cited by 97 publications
(14 citation statements)
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“…Low n-type levels ( 1 × 10 15 cm −3 ) were achieved in the as-grown state for x = 0.2-0.3, an obvious advantage in terms of reduced handling for Bridgman growth as no annealing stage was required-unlike other bulk methods. Bridgman material was used (Jones et al [29]) to establish the pressure-temperature diagram, by a combination of isothermal and twotemperature annealing. On the Hg-rich side at temperatures below 320 • C the n-type carrier concentration is controlled by residual impurities.…”
Section: Bridgman Growth Of Cmtmentioning
confidence: 99%
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“…Low n-type levels ( 1 × 10 15 cm −3 ) were achieved in the as-grown state for x = 0.2-0.3, an obvious advantage in terms of reduced handling for Bridgman growth as no annealing stage was required-unlike other bulk methods. Bridgman material was used (Jones et al [29]) to establish the pressure-temperature diagram, by a combination of isothermal and twotemperature annealing. On the Hg-rich side at temperatures below 320 • C the n-type carrier concentration is controlled by residual impurities.…”
Section: Bridgman Growth Of Cmtmentioning
confidence: 99%
“…Material with x > 0.3 is n-type as-grown, at a level above that found for Bridgman crystals but, at x < 0.3, the material is p-type. Such material converts to low (< 1 × 10 15 cm −3 ) n-type on the standard anneal treatment (Jones et al, [29]) indicating that metal vacancies are the cause of the p-type behaviour. Groups I and III elements are acceptors and donors, respectively, on the metal sites as they are in Bridgman, with the exception of Au.…”
Section: Accelerated Crucible Rotation Technique (Acrt)mentioning
confidence: 99%
“…It is known [105,[115][116][117][118] that Hgt-~Cd~Te is a defect material with electrically active native defects. If the crystal is grown in Te-saturated conditions, the most important defects are doubly charged Hg vacancies.…”
Section: Low-temperature Annealing and Electrical Propertiesmentioning
confidence: 99%
“…The process of low-temperature annealing can be performed isothermally (isothermal annealing), or with the source and the substrate at different temperatures (two-temperature annealing) [115]. In this case, the p ~ n conversion is performed more slowly if the mercury-zone temperature is lower than the substrate temperature.…”
Section: Low-temperature Annealing and Electrical Propertiesmentioning
confidence: 99%
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