2013
DOI: 10.1016/j.solmat.2012.09.026
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Effect of vicinal substrates on the growth and device performance of quantum dot solar cells

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Cited by 39 publications
(20 citation statements)
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“…y c for InAs QDs on GaAs is typically 1.5-2.0ML. The surface orientation is known to affect y c for InAs QD, increasing y c for increased miscut angle [16]. The results presented here illustrate an alternative method to change y c , by depositing InAs QDs on an InGaP surface.…”
Section: Discussionmentioning
confidence: 74%
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“…y c for InAs QDs on GaAs is typically 1.5-2.0ML. The surface orientation is known to affect y c for InAs QD, increasing y c for increased miscut angle [16]. The results presented here illustrate an alternative method to change y c , by depositing InAs QDs on an InGaP surface.…”
Section: Discussionmentioning
confidence: 74%
“…There is a potential benefit if this is indeed the case. If high optical quality QDs can be obtained without a WL then this approach may eliminate a major loss of carriers through WL recombination, which is a considerable drawback in the InAs/GaAs system [16]. These mechanisms are speculative at present and additional work would be required to further elucidate the actual condition at the surface.…”
Section: Discussionmentioning
confidence: 99%
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“…41,[66][67][68] Driscoll et al 69 performed simulations on three positions for InAs QD located in the intrinsic region: (1) near the n-doped base, (2) exact center of i-region, and (3) near the p-doped emitter. 69 From the simulation, they found that J sc was nearly identical for the three positions as all were located in a high electric field region and carrier collection remained efficient for all three conditions.…”
Section: Effect Of Quantum Dot Location On Carrier Transportation Andmentioning
confidence: 99%
“…28 On the other hand, J 0 is the radiative or diffusion recombination dark saturation current, and its magnitude is basically related to the material properties such as bandgap (the lower the bandgap, the higher the J 0 ) and diffusion length (the shorter diffusion length, the higher the J 0 ). 37,40,41 The generation of defects is usually more enhanced for the InAs QDs-embedded GaAs because of the accumulated strain compared with the i-GaAs layer without QDs, which inevitably cause the increase of J 0SRH and the decrease of V oc .…”
Section: Introductionmentioning
confidence: 99%