Effect of microscopic parameters on EBSD spatial resolution

Chen, Delphic; Kuo, Jui Chao; Wu, Wenchuan

doi:10.1016/j.ultramic.2011.06.007

Cited by 116 publications

(69 citation statements)

References 17 publications

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“…TKD method is also referred to as "transmission EBSD". The best planar resolution of electron back-scattered diffraction (EBSD) in conventional geometry is typically between 30 and 50 nm, and can be up to 200 nm in the perpendicular longitudinal (primary beam) direction, depending on the material and acceleration voltage [23]. For ultra-fine grained materials with grain size from few tens to hundreds of nanometers, the resolution of conventional EBSD is not sufficient since the interaction volume is comparable to the grain size.…”

Section: Experimental Methodsmentioning

confidence: 99%

Cryogenic Milling of Titanium Powder

Kozlík

Stráský

Harcuba

et al. 2018

Metals

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Ti Grade 2 was prepared by cryogenic attritor milling in liquid nitrogen and liquid argon. Two types of milling balls were used-stainless steel balls and heavy tungsten carbide balls. The effect of processing parameters on particle size and morphology, contamination of powder and its microhardness was investigated. Milling in liquid nitrogen was not feasible due to excessive contamination by nitrogen. Minor reduction of particle size and significant alterations in particle morphology depended on type of milling balls and application of stearic acid as processing control agent. Heavily deformed ultra-fine grained (UFG) internal microstructure of powder particles was observed by the method of "transmission Kikuchi diffraction".

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Section: Experimental Methodsmentioning

confidence: 99%

Cryogenic Milling of Titanium Powder

Kozlík

Stráský

Harcuba

et al. 2018

Metals

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“…Many of these studies have been largely qualitative in nature [21] and complement analysis of out of plane slip through slip trace analysis [22]. [24], potential to scan large areas, easy access to complementary SEM imaging modes (e.g. electron channelling contrast image (ECCI) [25] and cathodoluminescence (CL) [26]), and the improvement in angular resolution makes HR-EBSD a powerful technique to study fatigue deformation process in polycrystalline materials.…”

Section: *Text Only Click Here To Download Text Only: Manuscript_jun_mentioning

confidence: 99%

Evolution of intragranular stresses and dislocation densities during cyclic deformation of polycrystalline copper

2015

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We have used the cross-correlation based high resolution electron backscattering diffraction (HR-EBSD) technique to evaluate at high spatial resolution the spatial patterning of the type III intragranular residual stresses and geometrically necessary dislocation (GND) density within polycrystalline Cu after cyclic deformation. Oxygen free high conductivity (OFHC) polycrystalline copper samples were cyclically deformed under stress-control at a load ratio of 0.1 and EBSD measurements were made at points throughout the early stages of fatigue when strain amplitudes and cyclic creep rates are changing most significantly, namely at 0 cycles, 2 cycles, 200 cycles and 2000 cycles. Statistical analysis is presented showing that moderate correlations exist between stored GND density, residual intragranular stress and distance from the nearest grain boundaries or/and triple junctions. Ref: Ms.No.A-15-232Manuscript: "Evolution of intragranular stresses and dislocation densities during cyclic deformation of polycrystalline copper" Dear Prof MahajanWe are very pleased to submit our revised manuscript to Acta Materialia for considering publication. Each of referee's comment and suggestion has been carefully addressed. Detailed explanations are included in the 'Response to Reviewer' file. All changes and corrections to our original manuscript have been highlighted in the revised manuscript.We would be very grateful for Editor's effort and time to process our manuscript and very look forward to hearing from you soon. Authors are very grateful to Reviewer's time, effort and constructive comments. In order to comprehensively revise our manuscript and give most appropriate response, we address Reviewer's comments one by one in detail in the following section. (Reviewer's comments are marked using red colour, correction to the manuscript are marked as yellow and Authors responses are marked as blue.Editor's/Reviewer's comments: This paper gives some interesting insights into dislocation and stress development during cyclic testing. Overall the analysis is appropriate, although I was surprised about two things: the correlations reported in the paper are pretty low; I was surprised that the authors did not pursue this a little further to factor out some of the issues (such as substructure development) that appear to play an important role in causing this. Relating to the previous point, the authors mention dislocation substructure development in an extremely cursory and handwaving fashion. They mention correlations with orientation and different types of structure, but in an almost off-handed way that does not even connect with the wealth of literature on the subject. Issue 2. should certainly be fixed, and it would be nice to improve issue 1. a little if possible. I have made comments on the manuscript that I hope will be helpful (including pointing out a few typos).1. These coefficients are low. The correlation coefficients are generally not very high (~-0.2) (That's a bit of a stretch) This is a sensible suggestion and ...

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“…Therefore, during the evaluation of real data, the cut-off introduced by the finite beam size should be considered in the analysis. Since the characteristic linear size of the illuminated volume (of about 10 Â 10 Â 50 nm 3 ) 23,24 can be of the same order of magnitude as the average dislocationdislocation spacing in a heavily deformed metal (of %30 nm for q % 10 15 m -2 ), the finite beam size could become a limiting factor for the application of the method.…”

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confidence: 99%

Comparison of the dislocation density obtained by HR-EBSD and X-ray profile analysis

Kalácska

Groma

Borbély

et al. 2017

Applied Physics Letters

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Based on the cross correlation analysis of the Kikuchi diffraction patterns high-resolution EBSD is a well established method to determine the internal stress in deformed crystalline materials. In many cases, however, the stress values obtained at the different scanning points have a large (in the order of GPa) scatter. As it was first demonstrated by Wilkinson and co-workers this is due to the long tail of the probability distribution of the internal stress ($P(\sigma)$) generated by the dislocations present in the system. According to the theoretical investigations of Groma and co-workers the tail of $P(\sigma)$ is inverse cubic with prefactor proportional to the total dislocation density $<\rho>$. In this paper we present a direct comparison of the X-ray line broadening and $P(\sigma)$ obtained by EBSD on deformed Cu single crystals. It is shown that $<\rho>$ can be determined from $P(\sigma)$. This opens new perspectives for the application of EBSD in determining mesoscale parameters in a heterogeneous sample

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Effect of microscopic parameters on EBSD spatial resolution

Cited by 116 publications

References 17 publications

Cryogenic Milling of Titanium Powder

Cryogenic Milling of Titanium Powder

Evolution of intragranular stresses and dislocation densities during cyclic deformation of polycrystalline copper

Comparison of the dislocation density obtained by HR-EBSD and X-ray profile analysis

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