2010
DOI: 10.1002/crat.201000294
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Effect of isomorphic atom substitution on the refractive index and oscillator parameters of TlInS2xSe2(1‐x) (0.25 ≤ x ≤ 1) layered mixed crystals

Abstract: The optical properties of TlInS 2x Se 2(1-x) mixed crystals (0.25 ≤ x ≤ 1) have been studied at room temperature through the transmittance and reflectivity measurements in the wavelength range of 400-1100 nm. The spectral dependence of the refractive index for all compositions of studied crystals were obtained. The dispersion of the refractive index is discussed in terms of the Wemple-DiDomenico single-effective-oscillator model. The compositional dependencies of refractive index dispersion parameters: oscilla… Show more

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Cited by 6 publications
(4 citation statements)
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“…Similarly, in this work we have estimated the values of the refractive index (n) and the film thickness (d). The behaviour of obtained refractive index (n) can be described by the model of number of oscillation to calculate the single oscillation (E o ) and dispersion energy (E d ) [16][17][18] of the thin films. In this work we present systematic preparation of SnS in powder form and characterise the optical properties of SnS thin films deposited on ITO coated glass slide substrate using thermal evaporation techniques.…”
Section: Introductionmentioning
confidence: 99%
“…Similarly, in this work we have estimated the values of the refractive index (n) and the film thickness (d). The behaviour of obtained refractive index (n) can be described by the model of number of oscillation to calculate the single oscillation (E o ) and dispersion energy (E d ) [16][17][18] of the thin films. In this work we present systematic preparation of SnS in powder form and characterise the optical properties of SnS thin films deposited on ITO coated glass slide substrate using thermal evaporation techniques.…”
Section: Introductionmentioning
confidence: 99%
“…The refractive index is a characteristic parameter of the semiconductor materials, related to the local field within the material. The estimated refractive index n for the tin sulfide films grown at different sulphidisation temperature, evaluated using expression (8) [57], were plotted in figure 11 as a function of wavelength in the range of 500-2500 nm.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…The refractive indices, extinction coefficients, real and imaginary parts of dielectric function have been calculated from ellipsometric data. Moreover, the refractive index dispersion parameters: oscillator energy, dispersion energy and zero-frequency refractive index of TlGa(S 1-x Se x ) 2 , TlGa 1-x In x S 2 and TlIn(Se 1-x S x ) 2 mixed crystals have been reported [21][22][23].…”
Section: Introductionmentioning
confidence: 99%