1996
DOI: 10.1007/bf00356009
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Effect of heavy doping in SnO2:F films

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Cited by 84 publications
(59 citation statements)
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“…These values are inconsistent with a model in which F dopants initially fill oxygen vacancies, replacing those double donors by F single donors and thereby reducing n o . 13 For each F ion in this sample, there are an additional 60 free electrons compared with the undoped SnO 2 . Thus, the very process of F doping in SPEED is introducing electrically active defects far above the actual number of dopant impurities.…”
Section: Discussionmentioning
confidence: 99%
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“…These values are inconsistent with a model in which F dopants initially fill oxygen vacancies, replacing those double donors by F single donors and thereby reducing n o . 13 For each F ion in this sample, there are an additional 60 free electrons compared with the undoped SnO 2 . Thus, the very process of F doping in SPEED is introducing electrically active defects far above the actual number of dopant impurities.…”
Section: Discussionmentioning
confidence: 99%
“…11,12 Fluorine dopants are initially expected to fill oxygen vacancies, which relieves the surrounding lattice distortion. 13 Thus, low-level fluorine doping may actually decrease freeelectron density because two free electrons of the vacancy are reduced to one, due to the reception of the other electron by the fluorine to complete the bond. At higher concentrations, F may replace O in the lattice, causing an increase in the carrier concentration.…”
Section: Introductionmentioning
confidence: 99%
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“…In the case of FTO, a decrease in conductivity, however, has been reported for high fluorine contents, which was assumed to be due to the occurrence of fluorine interstitial acceptors. 14,15 On the other hand, anomalies in electrical conductivity measurements of pure and slightly acceptor-doped SnO 2 samples as a function of oxygen partial pressure and dilatation measurements 16 hint to the presence of cation vacancies at elevated temperatures.…”
Section: Introductionmentioning
confidence: 99%
“…The law of mass action of these equations suggests that the externally added dopant increases the rate of backward reaction through the fourth power dependence of HF concentration. Hence, HF will determine the rate of deposition of the SnO 2 films by the competition between the rate of formation of SnO 2 and the rate of etching of SnO 2 (4). Since HF is a product from the doping NH 4 F. Thus, the deposition rate can be correlation to the amount of dopant.…”
Section: Results and Discusssionmentioning
confidence: 99%