2011
DOI: 10.1016/j.tsf.2011.06.094
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Effect of Ga doping on micro/structural, electrical and optical properties of pulsed laser deposited ZnO thin films

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Cited by 36 publications
(13 citation statements)
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“…The resistivity in the films is observed to gradually decrease from 0.14 to 1.06 9 10 -4 X cm as Ga contents are increased from 0.0 to 1.8 at.%, then increases to 3.95 9 10 -4 X cm. The lowest resistivity achieved in this study is *1.06 9 10 -4 X cm (electron concentration of 3.09 9 10 21 cm -3 ), which is lower than some previously reported values for the ZnO based TCO films [10,11]. With the Ga doping, the resistivity decreases because the Ga Zn acts as a more effective donor than oxygen vacancy in ZnO [11].…”
Section: Methodscontrasting
confidence: 67%
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“…The resistivity in the films is observed to gradually decrease from 0.14 to 1.06 9 10 -4 X cm as Ga contents are increased from 0.0 to 1.8 at.%, then increases to 3.95 9 10 -4 X cm. The lowest resistivity achieved in this study is *1.06 9 10 -4 X cm (electron concentration of 3.09 9 10 21 cm -3 ), which is lower than some previously reported values for the ZnO based TCO films [10,11]. With the Ga doping, the resistivity decreases because the Ga Zn acts as a more effective donor than oxygen vacancy in ZnO [11].…”
Section: Methodscontrasting
confidence: 67%
“…The (0002) peak for Ga doped ZnO films shifted to the higher angle, indicating the decrease of lattice constant along the c-axis due to Ga incorporation. Since bond length of Ga-O (1.92 Å ) is [10,16], Ga substituted at Zn sites would reduce the lattice constant along the c-axis, which is responsible for the shift of peak (0002). From Table I, it is demonstrated that the FWHM values increase with increasing Ga contents from 0.0 to 3.6 at.%, suggesting that the incorporation of Ga into ZnO film leads to degradation of crystal quality.…”
Section: Methodsmentioning
confidence: 99%
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“…Aluminum doping induced a decrease in average grain size. Many authors have reported that Al doping decrease the grain size due to the substitution of Zn ions (Rionic  0.074 nm) by the Al ion (Rionic  0.054 nm) and the difference between them [23].…”
Section: Structural Propertiesmentioning
confidence: 99%
“…Different technologies are used for preparation of transparent and conductive layers in dependence on the technique of deposition -chemical vapor deposition [4], solgel method [5], pulsed laser ablation [6], magnetron sputtering [7]. The magnetron sputtering is attractive and widely used because of possibility of large deposition area, film packing density and uniformity, low substrate temperature, etc.…”
Section: Introductionmentioning
confidence: 99%