2012
DOI: 10.7498/aps.61.195204
|View full text |Cite
|
Sign up to set email alerts
|

Effect of cooling rate on layering ICF cryogenic ice characterized by backlit shadowgraphy

Abstract: The effect of cooling rate on layering the deuterium ice inside inertial confinement fusion (ICF)spherical cryotarget is studied by backlit shadowgraphy. Experimentally, the temperature of ice is first determined by the calibration of temperature field around ICF cryotarget. The solidification process of deuterium in the cryotarget is in- situ characterized by backlit shadowgraphy. The power-spectrum density of the bright ring in shadowgraphy at different cooling rates is obtained. Experimental results demonst… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 8 publications
(1 citation statement)
references
References 21 publications
0
1
0
Order By: Relevance
“…Analyzing the image we can obtain information such as the uniformity, thickness and inner surface roughness of the D 2 layer in the great circular plane perpendicular to the optical axis [21]. First obtain the curve of the interface position corresponding to the ice layer as a function of the circumferential angle, and then perform Fourier expansion on it to obtain the mode-power spectra characteristic parameters of the D 2 layer in the great circle plane perpendicular to the optical axis, thereby obtaining the D 2 layer related information.…”
Section: Layer Characterizationmentioning
confidence: 99%
“…Analyzing the image we can obtain information such as the uniformity, thickness and inner surface roughness of the D 2 layer in the great circular plane perpendicular to the optical axis [21]. First obtain the curve of the interface position corresponding to the ice layer as a function of the circumferential angle, and then perform Fourier expansion on it to obtain the mode-power spectra characteristic parameters of the D 2 layer in the great circle plane perpendicular to the optical axis, thereby obtaining the D 2 layer related information.…”
Section: Layer Characterizationmentioning
confidence: 99%